ESD failure mechanisms and models
by
 
Voldman, Steven H.

Title
: 
ESD failure mechanisms and models

Author
: 
Voldman, Steven H.

Personal Author
: 
Voldman, Steven H.

Publication Information
: 
Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009.

Physical Description
: 
xxiv, 384 p.

Subject Term
: 
Semiconductors -- Failures.
 
Integrated circuits -- Protection.
 
Integrated circuits -- Testing.
 
Integrated circuits -- Reliability.
 
Electric discharges.
 
Electrostatics.

Genre
: 
Electronic books.

Added Corporate Author
: 
ProQuest (Firm)

Electronic Access
: 
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Shelf NumberItem BarcodeShelf LocationShelf LocationHolding Information
TK7871.852 .V65 2009955926-1001Ebook CentralEbook Central