Transient-induced latchup in CMOS integrated circuits
by
 
Ker, Ming-Dou.

Title
: 
Transient-induced latchup in CMOS integrated circuits

Author
: 
Ker, Ming-Dou.

Personal Author
: 
Ker, Ming-Dou.

Publication Information
: 
Singapore ; Hoboken, NJ : Wiley, c2009.

Physical Description
: 
xiii, 249 p. : ill.

Subject Term
: 
Metal oxide semiconductors, Complementary -- Defects.
 
Metal oxide semiconductors, Complementary -- Reliability.

Genre
: 
Electronic books.

Added Author
: 
Hsu, Sheng-Fu.

Added Corporate Author
: 
ProQuest (Firm)

Electronic Access
: 
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TK7871.99 .M44 K47 2009960684-1001Ebook CentralEbook Central