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      by 
      International Conference on Power and Energy Systems (3rd : 2013 : Bangkok, Thailand), issuing body.
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      Industrial electronics -- Congresses.
      by 
      International Conference on Mechanical and Electronics Engineering (2009 : Madras, India)
      Format: 
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      Electronics -- Congresses.
      by 
      Workshop on Frontiers in Electronics (2009 : Saint Croix, United States Virgin Islands)
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      Electronics -- Congresses.
      by 
      Symposium on Photo-Electronic Image Devices (5th : 1971 : Imperial College of Science and Technology)
      Format: 
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      Electronics -- Congresses.
      by 
      International Conference of Antenna s and Propagation (6th : 1989)
      Format: 
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      Antennas (electronics) -- Congresses.
      by 
      Poole, Charles P., author.
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      Quantum electronics -- Congresses.
      by 
      International Conference on Antennas and Propagation (5th : 1987)
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      Excerpt: 
      Antennas (electronics) -- Congresses.
      by 
      Nakahara, Miklo.
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      Quantum electronics -- Congresses.
      by 
      International Workshop on Nanotechnology and NICE Devices (2002 : Nagoya-shi, Japan)
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      Molecular electronics -- Congresses.
      by 
      International Conference on Antennas and Propagation (2nd : 1981)
      Format: 
      Excerpt: 
      Antennas (electronics) -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
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      International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (38th : 2012 : Phoenix Convention Center)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      Workshop on Frontiers in Electronics (5th : 2007 : Cozumel, Mexico)
      Format: 
      Excerpt: 
      Electronics -- Technological innovations -- Congresses.
      by 
      Workshop on Frontiers in Electronics (2004 : Aruba)
      Format: 
      Excerpt: 
      Electronics -- Technological innovations -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (31st : d2005 : San Jose, Calif.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (22nd : 1996 : Los Angeles, Calif.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      1994 IEEE Vehicular Technology Conference (44th : 1994 : Stockholm)
      Format: 
      Excerpt: 
      Electronics in transportation -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (41st : 2015 : Portland, Oregon), organizer.
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (25th : 1999 : Santa Clara, Calif.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (23rd : 1997 : Santa Clara, Calif.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      Pandikumar, Alagarsamy, editor.
      Format: 
      Excerpt: 
      Quantum electronics -- Congresses.
      by 
      Gettering and Defect Engineering in Semiconductor Technology Conference (15th : 2013 : Oxford, England)
      Format: 
      Excerpt: 
      Solid state electronics -- Congresses.
      by 
      International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.)
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      by 
      Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (2013 : Nice, France), issuing body.
      Format: 
      Excerpt: 
      Power electronics -- Congresses.
      by 
      Solvay Conference on Physics (22nd : 2001 : Delphi Lamia, Greece)
      Format: 
      Excerpt: 
      Quantum electronics -- Congresses.
      by 
      Charpin, P. (Pascale), 1949-
      Format: 
      Excerpt: 
      Electronics -- Congresses.
      by 
      Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (4th : 2011 : Tours, France)
      Format: 
      Excerpt: 
      Power electronics -- Congresses.
      by 
      Asian Conference on Solid State Ionics (13th : 2012 : Sendai, Japan)
      Format: 
      Excerpt: 
      Solid state electronics -- Congresses.
      by 
      NATO Advanced Research Workshop on Remote Cardiology Consultations Using Advanced Medical Technology--Applications for NATO Operations (2005 : Zagreb, Croatia)
      Format: 
      Excerpt: 
      Electronics in cardiology -- Congresses.
      by 
      IFAC International Conference on Fieldbus Systems and Their Applications (6th : 2005 : Puebla, Mexico)
      Format: 
      Excerpt: 
      Industrial electronics -- Congresses.
      by 
      Asian Conference on Solid State Ionics (10th : 2006 : Kandy, Sri Lanka)
      Format: 
      Excerpt: 
      Solid state electronics -- Congresses.
      by 
      IFAC International Conference on Fieldbus Systems and Their Applications (6th : 2005 : Puebla, Mexico)
      Format: 
      Excerpt: 
      Industrial electronics -- Congresses.