Search Results for Integrated circuits -- Reliability.

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Electronics reliability and measurement technology : nondestructive evaluation

Heyman, Joseph S.

MacEwan University Access (Unlimited Concurrent Users) from ScienceDirect
ScienceDirect https://www.sciencedirect.com/science/book/9780815511717

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Integrated circuits -- Reliability -- Congresses.

ESD failure mechanisms and models

Voldman, Steven H.

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Integrated circuits -- Reliability.

Terrestrial radiation effects in ULSI devices and electronic systems

Ibe, Eishi H., author.

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Integrated circuits -- Ultra large scale integration -- Reliability.

The circuit designer's companion

Williams, Tim, 1954-

ScienceDirect https://www.sciencedirect.com/science/book/9780750611428

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discussions of the principles of other design components, including linear integrated circuits, digital

Nanometer CMOS ICs From Basics to ASICs

J.M. Veendrick, Harry. author.

http://dx.doi.org/10.1007/978-3-319-47597-4

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CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and

The circuit designer's companion

Wilson, Peter.

ScienceDirect An electronic book accessible through the World Wide Web; click for information

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-programmable gate arrays) SOICs (small outline integrated circuits) high-speed digital circuit design testing: DFT

Carbon Nanotubes for Interconnects Process, Design and Applications

Todri-Sanial, Aida. editor.

http://dx.doi.org/10.1007/978-3-319-29746-0

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improve the performance, reliability and integration of 3D integrated circuits (ICs). This book will be

Reference data for engineers : radio, electronics, computer, and communications.

Middleton, Wendy.

ScienceDirect http://www.sciencedirect.com/science/book/9780750672917

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circuits -- Integrated circuits -- Optoelectronics -- Optical communications -- Analog communications

Advances in electronics and electron physics. Volume 30

Marton, L. (Ladislaus), 1901-

ScienceDirect http://www.sciencedirect.com/science/book/9780120145300

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-Scale Integrated Circuits; I. Relationship between Types of Integrated Circuits and Failure Mechanisms; II. Bipolar

10.

Fast Very-large-scale Integrated (VLSI) Circuits Simulations

Zhao, Xueqian, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10791659

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scaling of nowadays integrated circuits enters nano-scale regime, the traditional flow of circuit designs

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An Exploration of the Electromechanical Response of Suspended Graphene and Its Applications

Ng, Jimmy, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10828744

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electrostatic discharge protection tosemiconductor integrated circuits, establishing proof of concept via

12.

High-Sn-content GeSn Alloy towards Room-temperature Mid Infrared Laser

Dou, Wei, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10830648

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monolithically integrated into well-established and high-yield Si integrated circuits, which is favorable for

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