Front Cover; Advances in Imaging and Electron Physics, Volume 110; Copyright Page; CONTENTS; Contributors; Preface; Forthcoming Contributors; Chapter 1. Interference Scanning Optical Probe Microscopy: Principles and Applications; I. Introduction: Wave Optical Properties Near Surfaces; II. Outline; III. The Microscopic Perspective of Light-Matter Interaction: Wave Scattering; IV. Formation of Standing Waves: Propagative and Nonpropagative Waves; V. Imaging of Standing Waves: Shadow Formation and Detection through Probe Edge

VI. Quantum Limit in Near-Field Imaging: Short versus Intermediate Distance ObservationVII. Near-Field Holography: Amplitude and Phase Information; VIII. Experimental Results; IX. Concluding Remarks; Chapter 2. High-speed Electron Microscopy; I. Introduction; II. High-Speed Techniques; III. Time-Resolving Microscopes; IV. Concluding Remarks; Acknowledgments; References; Chapter 3. Soft Mathematical Morphology: Extensions, Algorithms, and Implementations; I. Introduction; II. Standard Mathematical Morphology; III. Soft Mathematical Morphology

IV. Soft Morphological Structuring Element DecompositionV. Fuzzy Soft Mathematical Morphology; VI. Implementations; VII. Concluding Remarks; References; Chapter 4. Difference in the Aharonov-Bohm Effect on Scattering States and Bound States; I. Introduction; II. AB Effect on Scattering States; III. AB Effect on Bound States; IV. AB Effect on a System of Both Bound States and Scattering States; V. Gauge Invariance and Scattering Theory; VI. Concluding Remarks; Acknowledgments; Index