This thesis describes the development of a complete scanning force microscope imaging system. At the heart of the system is a miniature cantilever fabricated from silicon nitride upon which is mounted an extremely sharp tip, which may be coated with a magnetic layer. The specimen to be imaged is scanned under the tip and the interaction between the tip and the surface, which may be by contact or by magnetic or other non-contact forces, causes the cantilever to deflect or otherwise change its dynamic characteristics. An image is built up corresponding to this tip-surface interaction. Two interferometric methods have been assessed for measuring the cantilever deflection, one using a fibre-optic sensor and the other a twin- beam arrangement. The latter has been found more suitable and is used in the prototype instrument. A feedback control system with comprehensive instrument operational software has been implemented, the parameters of which can be varied to enable different imaging modes to be studied. Care has also been taken to remove most of the geometrical scan distortions produced by operating a piezo-electric scanning tube in an open-loop mode. The performance of the prototype instrument is assessed and experimental results given to illustrate the capability of the system. Topographic and magnetic images are presented of a variety of samples including PtCo thin films, magnetic data storage disks, a read/write magnetic head, magneto-resistive sensors, and a grooved glass substrate. The interpretation of the magnetic images is discussed at length.