Defects and Dynamics in Block Copolymer Thin Films: A Study of Polymer Pattern Evolution with Environmentally-Controlled Atomic Force Microscopy
Title:
Defects and Dynamics in Block Copolymer Thin Films: A Study of Polymer Pattern Evolution with Environmentally-Controlled Atomic Force Microscopy
Author:
Raybin, Jonathan G., author. (orcid)0000-0001-9040-4241
Physical Description:
1 electronic resource (173 pages)
General Note:
Source: Dissertation Abstracts International, Volume: 80-08(E), Section: B.
Advisors: Steven J. Sibener Committee members: Ka Yee C. Lee; Andrei Tokmakoff.
Local Note:
School code: 0330
