Advances in electronics and electron physics. Volume 73, Aspects of charged particle optics

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Advances in electronics and electron physics. Volume 73, Aspects of charged particle optics

Title:

Advances in electronics and electron physics. Volume 73, Aspects of charged particle optics

Author:

Hawkes, P. W.

ISBN:

9780080577395

9780120146734

9781281411495

9786611411497

Publication Information:

Physical Description:

1 online resource (xii, 324 pages) : illustrations.

Series:

Advances in electronics and electron physics, 73

Advances in electronics and electron physics ; 73.

Contents:

Ion optics -- Proton microscopes and their applications -- An early history of the electron microscopes in the United States -- Electron beam testing.

Abstract:

ADV ELECTRONICS ELECTRON PHYSICS V73.

Subject Term:

Electron optics.

Proton beams.

Electron microscopes.

TECHNOLOGY & ENGINEERING -- Optics.

Electron microscopes. (OCoLC)fst00906679

Electron optics. (OCoLC)fst00906693

Proton beams. (OCoLC)fst01080066

Genre:

Electronic books.

Added Author:

Hawkes, P. W.

Electronic Access:

ScienceDirect http://www.sciencedirect.com/science/book/9780120146734

Available:*

Shelf Number	Item Barcode	Shelf Location	Status
QC793.5 .E62 A38 EB VOL. 73	1189500-1001	Elsevier E-Book Collections	Searching...

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