Front Cover; Advances in Imaging and Electron Physics, Volume 105; Copyright Page; Contents; Contributors; Preface; Chapter 1. Near-Sensor Image Processing; I. Introduction; II. A Near-Sensor Image Processor; III. Near-Sensor Image Processing Algorithms; IV. Adaptive Thresholding; V. Variable Sampling Time; VI. Grayscale Morphology; VII. Linear Convolution; VIII. A 2D NSIP Model; IX. Global Operations; X. Feature Extraction; XI. An NSIP System; XII. Sheet-of-Light Range Images; XIII. Conclusion; Acknowledgment; References.

Chapter 2. Digital Image Processing Technology for Scanning Electron MicroscopyI. Introduction; II. Proper Acquisition and Handling of SEM Image; III. Quality Improvement of SEM Images; IV. Image Measurement and Analysis; V. SEM Parameters Measurement; VI. Color SEM Image; VII. Automatic Focusing and Astigmatism Correction; VIII. Remote Control of SEM; IX. Active Image Processing; References; Chapter 3. Design and Performance of Shadow-Mask Color Cathode Ray Tubes; I. Introduction; II. Basic Structure of Shadow-Mask Tube and Principle of Operation; III. Alternative Gun and Screen Arrangements.

IV. Geometric ConsiderationsV. Shadow Masks; VI. Phosphor Materials and Screen Fabrication; VII. Deflection; VIII. Glass Bulbs; IX. Reduction of Screen Curvature and Use of Flat Tension Masks; X. Contrast Enhancement; XI. Moire; XII. Shadow-Mask Tubes for High-Resolution Display Applications; XIII. Human Factors and Health Considerations; XIV. Concluding Remarks; Acknowledgment; Appendix: Some Specifications of Representative Tube Types; References; Chapter 4. Electron Gun Systems for Color Cathode Ray Tubes; I. Historical Introduction.

II. Electron Beam Formation and Factors Limiting Current Density of SpotIII. Electron Gun Designs; IV. Cathodes; V. Techniques for Improving High-Tension Stability; Acknowledgment; References; Index.