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An Integrated Model for the Probabilistic Prediction of Yield Strength in Electron-Beam Additively Manufactured Ti-6Al-4V
Title:
An Integrated Model for the Probabilistic Prediction of Yield Strength in Electron-Beam Additively Manufactured Ti-6Al-4V
Author:
Ales, Thomas K., author. (orcid)0000-0002-9217-1020
ISBN:
9780438072459
Personal Author:
Physical Description:
1 electronic resource (77 pages)
General Note:
Source: Masters Abstracts International, Volume: 57-06M(E).
Advisors: Peter C. Collins Committee members: Richard LeSar; Frank Peters.
Abstract:
A complete model for the prediction of the yield strength of Titanium 6Al-4V in an additively manufactured component is presented herein. A thermal model is presented utilizing the ABAQUS simulation software to provide the process leg of the materials tetrahedron. The thermal model is fed into an implementation of the Langmuir equation that has been adapted for use in the simulation of the Electron-Beam Additive Manufacturing (EBAM) process. The predicted chemistry provided by the Langmuir equation for the Ti-6Al-4V alloy is then used in a phenomenological equation for the prediction of yield strength; a design probability curve is generated through random sampling of the thermal model. Using Weibull probability distributions, the model is verified against a rich mechanical and chemical database built from an actual EBAM build used in previous research.
Local Note:
School code: 0097
Added Corporate Author:
Available:*
Shelf Number | Item Barcode | Shelf Location | Status |
|---|---|---|---|
| XX(689797.1) | 689797-1001 | Proquest E-Thesis Collection | Searching... |
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