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      Cover image for ESD basics from semiconductor manufacturing to use
      61. 
      ESD basics from semiconductor manufacturing to use
      by 
      Voldman, Steven H.
      Click to View
      Format: 
      Excerpt: 
      Microelectronics.
      Cover image for Advances in electronics and electron physics. Volume 46
      62. 
      Advances in electronics and electron physics. Volume 46
      by 
      Marton, L. (Ladislaus), 1901-
      ScienceDirect http://www.sciencedirect.com/science/book/9780120146468
      Format: 
      Excerpt: 
      TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.
      Cover image for Advances in electronics and electron physics. Volume 27
      63. 
      Advances in electronics and electron physics. Volume 27
      by 
      Marton, L. (Ladislaus), 1901-
      ScienceDirect http://www.sciencedirect.com/science/book/9780120145270
      Format: 
      Excerpt: 
      TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.
      Cover image for Digital holography for MEMS and microsystem metrology
      64. 
      Digital holography for MEMS and microsystem metrology
      by 
      Asundi, Anand.
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      Format: 
      Excerpt: 
      Microelectronics -- Measurement.
      Cover image for Low-k nanoporous interdielectrics materials, thin film fabrications, structures and properties
      65. 
      Cover image for The PIC microcontroller your personal introductory course
      66. 
      The PIC microcontroller your personal introductory course
      by 
      Morton, John, 1980-
      Click to View
      Format: 
      Excerpt: 
      Microelectronics.
      Cover image for Crisis and innovation in Asian technology
      67. 
      Crisis and innovation in Asian technology
      by 
      Keller, William W. (William Walton), 1950-
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      Format: 
      Excerpt: 
      Microelectronics industry -- Southeast Asia.
      Cover image for Nanotechnology and nano-interface controlled electronic devices
      68. 
      Nanotechnology and nano-interface controlled electronic devices
      by 
      International Workshop on Nanotechnology and NICE Devices (2002 : Nagoya-shi, Japan)
      ScienceDirect http://www.sciencedirect.com/science/book/9780444510914
      Format: 
      Excerpt: 
      TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.
      Cover image for Microelectronic failure analysis desk reference. 2002 supplement
      69. 
      Microelectronic failure analysis desk reference. 2002 supplement
      by 
      Electronic Device Failure Analysis Society.
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      Format: 
      Excerpt: 
      Microelectronics -- Materials -- Defects -- Handbooks, manuals, etc.
      Cover image for Microelectronic failure analysis desk reference : 2001 supplement
      70. 
      Microelectronic failure analysis desk reference : 2001 supplement
      by 
      Electronic Device Failure Analysis Society.
      Click to View
      Format: 
      Excerpt: 
      Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc.
      Cover image for Plasma processing of materials scientific opportunities and technological challenges
      71. 
      Plasma processing of materials scientific opportunities and technological challenges
      by 
      National Research Council (U.S.). Panel on Plasma Processing of Materials.
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      Format: 
      Excerpt: 
      Microelectronics -- Materials -- Effect of radiation on.
      Cover image for Advances in electronics and electron physics. Volume 82
      72. 
      Advances in electronics and electron physics. Volume 82
      by 
      Hawkes, P. W.
      ScienceDirect http://www.sciencedirect.com/science/book/9780120146826
      Format: 
      Excerpt: 
      TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.
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