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SpringerLink (Online service)

(71)

ProQuest (Firm)

(29)

Marton, L. (Ladislaus), 1901-

(27)

(16)

Nalwa, Hari Singh, 1954-

(5)

Kohli, Rajiv, 1947-

(3)

(3)

Mittal, K. L., 1945-

(3)

Mukhopadhyay, Subhas Chandra. editor.

(3)

Bhunia, Swarup. editor.

(2)

Bindal, Ahmet. author.

(2)

Electronic Device Failure Analysis Society.

(2)

Hanaizumi, Osamu.

(2)

Hartmann, Heidi I.

(2)

Henini, Mohamed.

(2)

Horta, Nuno. author.

(2)

Institute of Materials, Minerals, and Mining.

(2)

Jayasundera, Krishanthi P. editor.

(2)

Kraut, Robert E.

(2)

Licari, James J., 1930-

(2)

Lourenço, Nuno. author.

(2)

(2)

Martins, Ricardo. author.

(2)

Menz, W. (Wolfgang)

(2)

National Research Council (U.S.). Committee on Women's Employment and Related Social Issues. Panel on Technology and Women's Employment.

(2)

Ohring, Milton, 1936-

(2)

Postolache, Octavian Adrian. editor.

(2)

Powell, Ronald A.

(2)

Singh, Hema. author.

(2)

Smith, David J. (David John), 1943 June 22-

(2)

Swain, Akshya K. editor.

(2)

(2)

Unno, Masafumi.

(2)

4M Network of Excellence (Sixth Framework Programme)

(1)

Ahmed, Naveed. editor.

(1)

Ahsan, Tanweer, editor.

(1)

Akin, Abdulkadir. author.

(1)

Al-Ahmari, Abdulrahman M. editor.

(1)

Alexander, Perry.

(1)

Alhamadani, Yasir, author.

(1)

Aljafar, Muayad Jaafar, author.

(1)

Angelakis, Vangelis. editor.

(1)

Antony, Simy. author.

(1)

Ardebili, Haleh.

(1)

Asia-Pacific Chemical Reaction Engineering Symposium (4th : 2005 : Kyŏngju-si, Korea)

(1)

Askerzade, Iman. author.

(1)

(1)

Babu, Suryadevara, editor.

(1)

Balkanski, Minko, 1927-

(1)

Ballantyne, J. P.

(1)

(1)

Banerjee, Amal. author.

(1)

(1)

Baschirotto, Andrea. editor.

(1)

Bassi, Alessandro. editor.

(1)

Bates, Martin, 1952-

(1)

(1)

Berthier, Jean, 1952-

(1)

Bhugra, Harmeet. editor.

(1)

Bin, Ning. author.

(1)

Birolini, Alessandro. author.

(1)

Bishop, O. N. (Owen Neville)

(1)

Bleuler, Ernst, 1916-2007.

(1)

Bossuet, Lilian. editor.

(1)

Bothe, Hans-Werner.

(1)

Bozbey, Ali. author.

(1)

(1)

Brakke, Kenneth A.

(1)

Brewer, George Raymond, 1922-

(1)

Brindley, Keith.

(1)

Brown, James Emery, author.

(1)

(1)

Bucknall, David G.

(1)

Campardo, Giovanni. editor.

(1)

Cantürk, Mehmet. author.

(1)

Chakrabarty, Krishnendu. author.

(1)

Chan, Chee Seng. author.

(1)

Chang, Chip-Hong. editor.

(1)

Chaves, Ricardo. editor.

(1)

Chen, Claire Lifan. author.

(1)

Chen, Xiaoming. author.

(1)

Chen, Yingzhong, author.

(1)

Choi, Gwan S. author.

(1)

Chrisey, Douglas B.

(1)

Chung, Yip-wah, 1950-

(1)

Churiwala, Sanjay. editor.

(1)

Claesen, Luc J. M.

(1)

(1)

Clark, James W.

(1)

(1)

(1)

Cogal, Ömer. author.

(1)

Commission of the European Communities.

(1)

Conference on "Microelectronics, Microsystems, and Nanotechnology" (1st : 2000 : Athens, Greece). Papers. 2001.

(1)

Cornell University. Chemical Engineering. degree granting institution.

(1)

Corset, Jacques.

(1)

Costello, Suzanne, author.

(1)

Craninckx, Jan. author.

(1)

(1)

D'Agostino, Riccardo.

(1)

(1)

Dahl, Deborah A. editor.

(1)

Darwish, Saied Muhammed Hassan. editor.

(1)

De Gloria, Alessandro. editor.

(1)

Deen, M. Jamal.

(1)

Dehollain, Catherine. author.

(1)

Deschamps, Jean-Pierre. author.

(1)

Desmulliez, Marc P. Y., 1963- author.

(1)

(1)

Di Natale, Giorgio. editor.

(1)

Di Paolo Emilio, Maurizio. author.

(1)

Dietl, Tomasz, editor.

(1)

Dimov, S. S., 1959-

(1)

Dong, Zheng-hong. author.

(1)

Drechsler, Rolf. author.

(1)

Dutta, Mausumi. author.

(1)

EUROFORM (Organization)

(1)

Eckmiller, Rolf, 1942-

(1)

Einspruch, Norman G.

(1)

El-Khazali, Reyad. author.

(1)

Elsevier Science Publishers.

(1)

Elwakil, Ahmed. author.

(1)

European Commission.

(1)

European Summer School "III-V Microelectronics" (1990 : Strasbourg, France)

(1)

Evtukh, Anatoliy, author.

(1)

Fabre, Christian. editor.

(1)

Fan, Qinwen. author.

(1)

Faruque, Saleh. author.

(1)

Fernandes, Jorge. author.

(1)

(1)

Fillon, Bertrand.

(1)

Forte, Domenic. editor.

(1)

Fouto, David. author.

(1)

Frenzel, Louis E., Jr., 1938-

(1)

Friedrichs, Günter.

(1)

Fukuda, T. (Toshio), 1948-

(1)

Future Trends in Microelectronics (Conference) (7th : 2012 : Corsica, France)

(1)

Gandhi, Tejinder, editor.

(1)

Gastaldi, Roberto. editor.

(1)

Geng, Wen-dong. author.

(1)

Gentry, Cale Michael, author.

(1)

George, Boby. editor.

(1)

Ghayvat, Hemant. author.

(1)

Gil’mutdinov, Anis Kharisovich. author.

(1)

Goldberg, Lee H.

(1)

Gordon, Michael J. C., 1948-

(1)

Govorukha, Volodymyr. author.

(1)

Goyal, Deepak. editor.

(1)

Grabel, Arvin, joint author

(1)

Greenhouse, Hal.

(1)

(1)

Grosz, Asaf. editor.

(1)

(1)

Gu, Xinli. author.

(1)

Gunma Daigaku. Advanced Technology Research Center.

(1)

Gunma Daigaku. International Education and Research Center for Silicon Science.

(1)

(1)

Gutierrez-D., Edmundo A.

(1)

Ha, Soonhoi. editor.

(1)

Hack, K. (Klaus)

(1)

Haji-Sheikh, Michael J. editor.

(1)

Harding, Benjamin F.

(1)

Harjani, Ramesh. author.

(1)

Harpe, Pieter. editor.

(1)

Harris, David Money.

(1)

Harris, Sarah L.

(1)

Haxby, Robert Ozias, 1912- editor.

(1)

(1)

Herman, Irving P.

(1)

Herrick, Clyde N.

(1)

Heyman, Joseph S.

(1)

Hong Kong University of Science and Technology (Hong Kong). degree granting institution.

(1)

(1)

Hosokawa, Masuo.

(1)

Huijsing, Johan H. author.

(1)

Hwang, Y. M., author.

(1)

IFIP TC10/WG10.2 International Workshop on Higher Order Logic Theorem Proving and Its Applications (1992 : Leuven, Belgium)

(1)

Ibrahim, Dogan.

(1)

Ilčev, Stojče Dimov. author.

(1)

Inagaki, Michio.

(1)

Ingels, Mark. author.

(1)

International Conference on Advanced Materials (1991 : Strasbourg, France)

(1)

International Conference on Advanced Micro-Device Engineering (1st : 2009 : Kiryū-shi, Japan)

(1)

International Conference on Advanced Micro-Device Engineering (2nd : 2010 : Kiryū-shi, Japan)

(1)

International Conference on Advanced Micro-Device Engineering (4th : 2012 : Kiryū-shi, Japan)

(1)

International Conference on Micro Nano Devices, Structure and Computing Systems (3rd : 2014 : Singapore)

(1)

International Conference on Multi-Material Micro Manufacture (2nd : 2006 : Grenoble, France)

(1)

International Conference on Quantum-, Nano-, and Micro-Technologies (2nd : 2013 : Singapore)

(1)

International Symposium on Nanostructure Physics and Fabrication (1st : 1989 : Texas A & M University)

(1)

International Symposium on Silicon Science (5th : 2009 : Kiryū-shi, Japan)

(1)

International Symposium on Silicon Science (6th : 2010 : Kiryū-shi, Japan)

(1)

International Workshop on Nanotechnology and NICE Devices (2002 : Nagoya-shi, Japan)

(1)

International Workshop on Neurobionics (1st : 1992 : Goslar, Germany)

(1)

Interuniversity Micro-Electronics Center.

(1)

Iwamoto, Mitsumasa.

(1)

J.M. Veendrick, Harry. author.

(1)

Jalali, Bahram. author.

(1)

Jalil, Mansoor B. A.

(1)

Ji, Xiaofei. author.

(1)

Jiang, Zemin, 1926-

(1)

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Subject

Electronic books.

(188)

(117)

Microelectronics.

(89)

TECHNOLOGY & ENGINEERING -- Electronics -- Digital.

(88)

TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.

(88)

(76)

Electronics and Microelectronics, Instrumentation.

(67)

Electronic circuits.

(45)

Circuits and Systems.

(43)

(30)

Microprocessors.

(16)

Processor Architectures.

(15)

Nanotechnology.

(14)

Signal, Image and Speech Processing.

(13)

Electronic Circuits and Devices.

(11)

Electrical engineering.

(8)

Semiconductors.

(8)

Biomedical engineering.

(7)

Conference papers and proceedings.

(7)

Microelectronics -- Congresses.

(7)

(6)

Digital electronics.

(6)

Electronic materials.

(6)

Handbooks and manuals.

(6)

Image processing.

(6)

Materials science.

(6)

Optical and Electronic Materials.

(6)

Optical materials.

(6)

(6)

Communications Engineering, Networks.

(5)

(5)

Microelectromechanical systems.

(5)

TECHNOLOGY & ENGINEERING -- Mechanical.

(5)

(4)

Computational intelligence.

(4)

Electronic apparatus and appliances -- Design and construction.

(4)

Electronics -- Materials -- Testing -- Handbooks, manuals, etc.

(4)

Electronics -- Materials.

(4)

Microelectronics -- Materials.

(4)

Microwaves, RF and Optical Engineering.

(4)

(4)

Nanoelectronics.

(4)

Nanotechnology and Microengineering.

(4)

Optical engineering.

(4)

Programmable controllers.

(4)

TECHNOLOGY & ENGINEERING -- Electronics -- Semiconductors.

(4)

TECHNOLOGY & ENGINEERING -- Electronics -- Solid State.

(4)

(3)

Computer Communication Networks.

(3)

Computer communication systems.

(3)

Electron beams.

(3)

Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc.

(3)

Electronic packaging.

(3)

(3)

Image Processing and Computer Vision.

(3)

Information Systems Applications (incl. Internet).

(3)

Measurement Science and Instrumentation.

(3)

(3)

Mechanical engineering.

(3)

Metallic Materials.

(3)

(3)

Microelectromechanical systems -- Design and construction.

(3)

Microelectronics -- Materials -- Defects -- Handbooks, manuals, etc.

(3)

Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc.

(3)

Microelectronics -- Social aspects.

(3)

Microtechnology.

(3)

Mikroelektronik.

(3)

Nanostructured materials.

(3)

Nanostructures -- Congresses.

(3)

Physical measurements.

(3)

Power electronics.

(3)

Reliability (Engineering)

(3)

Semiconductors -- Defects -- Handbooks, manuals, etc.

(3)

TECHNOLOGY & ENGINEERING -- Nanotechnology & MEMS.

(3)

User Interfaces and Human Computer Interaction.

(3)

User interfaces (Computer systems).

(3)

(2)

(2)

(2)

Biochemical engineering.

(2)

(2)

(2)

Computer security.

(2)

Computer systems -- Congresses.

(2)

Control engineering.

(2)

(2)

Data Encryption.

(2)

Data Mining and Knowledge Discovery.

(2)

Data encryption (Computer science).

(2)

(2)

(2)

(2)

Electromagnetic waves.

(2)

Electromagnetism.

(2)

Electron microscopy.

(2)

Electron optics.

(2)

Electronic circuit design.

(2)

Electronic industries.

(2)

(2)

Electronics -- Mathematics.

(2)

Elektronisches Bauelement

(2)

Eletrônica de potência.

(2)

Energy harvesting.

(2)

Engenharia eletrônica.

(2)

Engineering mathematics.

(2)

Environmental monitoring.

(2)

Expert systems (Computer science)

(2)

Field programmable gate arrays.

(2)

(2)

Industrial safety.

(2)

Information technology -- Congresses.

(2)

Integrated circuits -- Design and construction.

(2)

Integrierte Schaltung.

(2)

(2)

Lithographie par faisceau d'électrons.

(2)

Maintainability (Engineering)

(2)

Microcontrollers -- Programming.

(2)

Microelectronics -- Design.

(2)

Microelectronics industry.

(2)

(2)

Microélectronique.

(2)

Molecular electronics.

(2)

Monitoring/Environmental Analysis.

(2)

Nanotecnologia.

(2)

Office practice -- Automation.

(2)

(2)

Optoelectronic devices.

(2)

Particles -- Measurement.

(2)

(2)

Plasma engineering.

(2)

Plasma etching.

(2)

(2)

Protective coatings.

(2)

Quantum electronics.

(2)

(2)

Rapid prototyping.

(2)

SCIENCE -- Chemistry -- Physical & Theoretical.

(2)

SCIENCE -- Physics -- Condensed Matter.

(2)

Sealing (Technology)

(2)

Silicon -- Congresses.

(2)

Surface chemistry.

(2)

Surface contamination -- Prevention.

(2)

Surfaces (Physics)

(2)

Surfaces (Technology) -- Inspection.

(2)

Systems and Data Security.

(2)

TECHNOLOGY & ENGINEERING -- Chemical & Biochemical.

(2)

TECHNOLOGY & ENGINEERING -- Technical & Manufacturing Industries & Trades.

(2)

(2)

Women -- Employment -- Government policy -- United States.

(2)

Women -- Employment.

(2)

Women white collar workers -- Effect of technological innovations on.

(2)

Zuverlässigkeit

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Adhesive joints.

(1)

Aerospace Technology and Astronautics.

(1)

Aerospace engineering.

(1)

(1)

(1)

(1)

(1)

Alternative Energy.

(1)

Amorpher Festkörper

(1)

Amorpher Halbleiter

(1)

Amorpher Zustand

(1)

Analyse spectrale.

(1)

Analytical chemistry.

(1)

Antennas (Electronics)

(1)

Appareils électroniques -- Conception et construction -- Aspect de l'environnement.

(1)

Appareils électroniques -- Fiabilité.

(1)

Appl.Mathematics/Computational Methods of Engineering.

(1)

Applications of Nonlinear Dynamics and Chaos Theory.

(1)

Applied mathematics.

(1)

Architecture des ordinateurs.

(1)

Arquitetura e organização de computadores.

(1)

Artificial Intelligence (incl. Robotics).

(1)

Artificial intelligence.

(1)

Aspects sociaux.

(1)

(1)

Aufsatzsammlung

(1)

Aufsatzsammlung.

(1)

Automatic control -- Congresses.

(1)

Automatic theorem proving -- Congresses.

(1)

Automatic theorem proving.

(1)

(1)

BUSINESS & ECONOMICS -- Labor.

(1)

Baixa temperatura.

(1)

(1)

Bioinformatics.

(1)

(1)

Biomedical Engineering/Biotechnology.

(1)

(1)

Library

Başkent Library

Shelf Location

Central Library

Elsevier E-Book Collections

Proquest E-Thesis Collection

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Cover image for Silicon science and advanced micro-device engineering I selected, peer reviewed papers from the 5th International Symposium on Silicon Science and the 1st International Conference on Advanced Micro-Device Engineering (ISSS & AMDE 2009), was held by the International Education and Research Center for Silicon Science and the Advanced Technology Research Center (ATEC), Gunma University on 10 and 11 December 2009 in Kiryu, Japan

Silicon science and advanced micro-device engineering I selected, peer reviewed papers from the 5th International Symposium on Silicon Science and the 1st International Conference on Advanced Micro-Device Engineering (ISSS & AMDE 2009), was held by the International Education and Research Center for Silicon Science and the Advanced Technology Research Center (ATEC), Gunma University on 10 and 11 December 2009 in Kiryu, Japan

49.

Silicon science and advanced micro-device engineering I selected, peer reviewed papers from the 5th International Symposium on Silicon Science and the 1st International Conference on Advanced Micro-Device Engineering (ISSS & AMDE 2009), was held by the International Education and Research Center for Silicon Science and the Advanced Technology Research Center (ATEC), Gunma University on 10 and 11 December 2009 in Kiryu, Japan

by

International Symposium on Silicon Science (5th : 2009 : Kiryū-shi, Japan)

Format:

Excerpt:

Microelectronics -- Congresses.

Cover image for SiP-system in package design and simulation : MentorGraphics Expedition Enterprise Flow advanced design guide

SiP-system in package design and simulation : MentorGraphics Expedition Enterprise Flow advanced design guide

50.

SiP-system in package design and simulation : MentorGraphics Expedition Enterprise Flow advanced design guide

by

Li, Suny, 1974- author.

Format:

Excerpt:

Multichip modules (Microelectronics) -- Design and construction.

Cover image for Computation and communication technologies

Computation and communication technologies

51.

Computation and communication technologies

by

Senthil, Kumar T., editor.

Format:

Excerpt:

Microelectronics -- Congresses.

Cover image for ESD basics from semiconductor manufacturing to use

ESD basics from semiconductor manufacturing to use

52.

ESD basics from semiconductor manufacturing to use

by

Voldman, Steven H.

Format:

Excerpt:

Microelectronics.

Cover image for Advances in electronics and electron physics. Volume 46

Advances in electronics and electron physics. Volume 46

53.

Advances in electronics and electron physics. Volume 46

by

Marton, L. (Ladislaus), 1901-

ScienceDirect http://www.sciencedirect.com/science/book/9780120146468

Format:

Excerpt:

TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.

Cover image for Advances in electronics and electron physics. Volume 27

Advances in electronics and electron physics. Volume 27

54.

Advances in electronics and electron physics. Volume 27

by

Marton, L. (Ladislaus), 1901-

ScienceDirect http://www.sciencedirect.com/science/book/9780120145270

Format:

Excerpt:

TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.

Cover image for Digital holography for MEMS and microsystem metrology

Digital holography for MEMS and microsystem metrology

55.

Digital holography for MEMS and microsystem metrology

by

Asundi, Anand.

Format:

Excerpt:

Microelectronics -- Measurement.

Cover image for Low-k nanoporous interdielectrics materials, thin film fabrications, structures and properties

Low-k nanoporous interdielectrics materials, thin film fabrications, structures and properties

56.

Low-k nanoporous interdielectrics materials, thin film fabrications, structures and properties

by

Ree, Moonhor.

Format:

Excerpt:

Microelectronics -- Materials.

Cover image for The PIC microcontroller your personal introductory course

The PIC microcontroller your personal introductory course

57.

The PIC microcontroller your personal introductory course

by

Morton, John, 1980-

Format:

Excerpt:

Microelectronics.

Cover image for Crisis and innovation in Asian technology

Crisis and innovation in Asian technology

58.

Crisis and innovation in Asian technology

by

Keller, William W. (William Walton), 1950-

Format:

Excerpt:

Microelectronics industry -- Southeast Asia.

Cover image for Nanotechnology and nano-interface controlled electronic devices

Nanotechnology and nano-interface controlled electronic devices

59.

Nanotechnology and nano-interface controlled electronic devices

by

International Workshop on Nanotechnology and NICE Devices (2002 : Nagoya-shi, Japan)

ScienceDirect http://www.sciencedirect.com/science/book/9780444510914

Format:

Excerpt:

TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.

Cover image for Microelectronic failure analysis desk reference. 2002 supplement

Microelectronic failure analysis desk reference. 2002 supplement

60.

Microelectronic failure analysis desk reference. 2002 supplement

by

Electronic Device Failure Analysis Society.

Format:

Excerpt:

Microelectronics -- Materials -- Defects -- Handbooks, manuals, etc.

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