Search ResultsElectronic Resources
Limit Search Results
Author
ProQuest (Firm)
(47)
ASM International.
(15)
Electronic Device Failure Analysis Society.
(14)
SpringerLink (Online service)
(7)
Ebnesajjad, Sina.
(3)
Material Type
Language
Publication Date
-
Subject
Electronic books.
(133)
Electronics -- Materials.
(21)
Electronic apparatus and appliances -- Testing -- Congresses.
(20)
Electronics -- Materials -- Testing -- Congresses.
(20)
Engineering.
(15)
Library
Shelf Location
Switch to list view
Switch to thumbnail view
Select an Action
176 Results Found Subscribe to search results
000000000000DEFAULT
Print
Select a list
Make this your default list.
The following items were successfully added.
    There was an error while adding the following items. Please try again.
      Cover image for ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
      49. 
      ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
      by 
      International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.)
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      Cover image for ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California
      50. 
      ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California
      by 
      International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.)
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      Cover image for ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.
      51. 
      ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.
      by 
      International Symposium for Testing and Failure Analysis (28th : 2002 : Phoenix, Ariz.)
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      Cover image for ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California
      52. 
      ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California
      by 
      International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.)
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      Cover image for ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
      53. 
      ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
      by 
      International Symposium for Testing and Failure Analysis (26th : 2000 : Bellevue, Wash.)
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      Cover image for ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
      54. 
      ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
      by 
      International Symposium for Testing and Failure Analysis (25th : 1999 : Santa Clara, Calif.)
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      Cover image for ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
      55. 
      ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
      by 
      International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.)
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      Cover image for ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California
      56. 
      ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California
      by 
      International Symposium for Testing and Failure Analysis (23rd : 1997 : Santa Clara, Calif.)
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      Cover image for Microelectronics failure analysis : desk reference
      57. 
      Microelectronics failure analysis : desk reference
      by 
      Gandhi, Tejinder, editor.
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Handbooks, manuals, etc.
      Cover image for Microelectronic failure analysis desk reference : 2001 supplement
      58. 
      Microelectronic failure analysis desk reference : 2001 supplement
      by 
      Electronic Device Failure Analysis Society.
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Handbooks, manuals, etc.
      Cover image for Microelectronics failure analysis desk reference
      59. 
      Microelectronics failure analysis desk reference
      by 
      Ross, Richard J.
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Handbooks, manuals, etc.
      Cover image for ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA
      60. 
      ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA
      by 
      International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.)
      Click to View
      Format: 
      Excerpt: 
      Electronics -- Materials -- Testing -- Congresses.
      Select an Action