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      by 
      International Symposium for Testing and Failure Analysis (22nd : 1996 : Los Angeles, Calif.)
      Format: 
      Excerpt: 
      ASM International. Electronic Materials and Processing Division.
      by 
      Moore, Thomas M.
      Format: 
      Excerpt: 
      Electronic packaging -- Materials.
      by 
      Léonard, François, 1972-
      Format: 
      Excerpt: 
      Electronic apparatus and appliances -- Materials.
      by 
      Drobny, Jiri George.
      Format: 
      Excerpt: 
      Electronic apparatus and appliances -- Materials.
      by 
      Raju, Gorur G., 1937-
      Format: 
      Excerpt: 
      Electronic apparatus and appliances -- Materials.
      by 
      Jaeger, Richard C.
      Format: 
      Excerpt: 
      Electronic circuit design -- Audio visual materials -- CD-ROM's.
      by 
      Askerzade, Iman. author.
      Format: 
      Excerpt: 
      Optical and Electronic Materials.
      by 
      Rout, Saroj. author.
      Format: 
      Excerpt: 
      Optical and Electronic Materials.
      by 
      Li, Chunfei. author.
      Format: 
      Excerpt: 
      Optical and Electronic Materials.
      by 
      Wu, Bo. author.
      Format: 
      Excerpt: 
      Optical and Electronic Materials.