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      by 
      Goodhew, Peter J.
      Format: 
      Excerpt: 
      Electron microscopy and analysis Goodhew, Peter J.
      by 
      Hawkes, P. W.
      Format: 
      Excerpt: 
      and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended
      by 
      Hawkes, P. W.
      Format: 
      Excerpt: 
      & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on
      by 
      International Conference on the Strength of Metals and Alloys (5th : 1979 : Aachen, Germany)
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      , in-situ electron microscopy during deformation combination of elementary hardening mechanisms.--v. 3
      by 
      Chung, Yip-wah, 1950-
      Format: 
      Excerpt: 
      diffraction, scanning probe microscopy, and interfacial segregation. Understanding the behavior of materials
      by 
      Hawkes, P. W.
      Format: 
      Excerpt: 
      and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended
      by 
      Hawkes, P. W.
      Format: 
      Excerpt: 
      and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended
      by 
      Beaudoin, J. J.
      Format: 
      Excerpt: 
      and Nuclear Magnetic Resonance spectroscopy, to Scanning Electron Microscopy, x-ray diffraction
      by 
      Hull, Derek.
      Format: 
      Excerpt: 
      : Surface methods; Decoration methods; Electron microscopy; Movement of Dislocations: Concept of slip
      by 
      Zhao, Yiping.
      Format: 
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      microscopy) and diffraction techniques (such as light scattering, X-ray diffraction, and electron diffraction
      by 
      Tsen, Kong Thon.
      Format: 
      Excerpt: 
      Leitenstorfer and Alfred Laubereau -- Spatially and temporally resolved near-field scanning optical microscopy
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