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by
Hujsak, Karl, author. (orcid)0000-0003-3188-9730
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Computational Electron Microscopy for the Characterization of Soft, Hard, and Hybrid Materials /
by
Bhat, Anupama, author.
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spectroscopy, fluorescence microscopy, atomic force microscopy (AFM), as well as hyperspectral dark
by
Sprague-Klein, Emily A., author.
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, spectrally-resolved polarization dependent SERS, and high-resolution transmission electron microscopy (HRTEM
by
Milian, Luis Miguel Martinez, author.
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broad range of experimental measurements such as x-ray diffraction, transmission electron microscopy, x
by
Wang, Congcong, author.
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microscopy, and other tools such as X-ray diffraction and scanning electron microscopy have been used to
by
Ramezaniankeikanloo, Somayeh, author.
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that, atomic force microscopy (AFM) was used to quantify forces acting between P. putida surface
by
Patel, Pooja J., author.
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-ray diffraction (PXRD), polarized light microscopy (PLM) and in-vitro dissolution studies. The results have shown
by
Xu, Chaoqiang, author.
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electron spin resonance scanning tunneling microscopy (ESR-STM). The basic principle of the ESR-STM is that
by
Reifler, Ellen Sarah, author.
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structure of these materials is elucidated with high-resolution transmission electron microscopy; thickness





