Search Results for Electron microscopy.

1.

Investigation of Advanced Image Reconstruction Algorithms for Electron Microscopy

by

Jiang, Yi, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10749510

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Investigation of Advanced Image Reconstruction Algorithms for Electron Microscopy / Jiang, Yi

2.

Magnetic and Catalytic Properties of Transition Metal Doped MoS2 Nanocrystals

by

Milian, Luis Miguel Martinez, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823003

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broad range of experimental measurements such as x-ray diffraction, transmission electron microscopy, x

3.

Uncovering Atomic Structures in Two-Dimensional Lateral Heterojunctions

by

Han, Yimo, author. (orcid)0000-0003-0563-4611

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10807721

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This dissertation will employ transmission electron microscopy and related techniques to address

4.

Atomic Structure Studies of 2D Materials and Advancement of Dynamical LEEM/ microLEED-IV Analysis

by

Dai, Zhongwei, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10822675

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low-energy electron microscopy (LEEM) system, is a highly surface sensitive and non-intrusive surface

5.

Optical Spectroscopy of Defects in Two-Dimensional Materials and Applications for DNA Sequencing

by

Parkin, William M., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747777

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-gap quantum spin Hall insulators. We use aberration-corrected scanning electron microscopy to characterize the

6.

Shunt Passivation Process for CdTe Solar Cell: New Post Deposition Technique

by

Tessema, Misle M., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10835984

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, electron spray ionization - mass spectrometry, scanning electron microscopy, energy dispersive spectroscopy

7.

Spin Structures of the L10-MnGa(001) and alpha-Cr(001) Surfaces

by

Corbett, Joseph P., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10901964

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-ray diffraction and reflected high-energy electron diffraction respectively. Scanning tunneling microscopy, Auger

8.

Construction of an Electron Spin Resonance Scanning Tunneling Microscope for Single Spin Detection

by

Xu, Chaoqiang, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902209

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electron spin resonance scanning tunneling microscopy (ESR-STM). The basic principle of the ESR-STM is that

Cover image for Investigation of Intrinsic and Tunable Properties of Two-Dimensional Transition-Metal Dichalcogenides for Optical Applications

9.

Investigation of Intrinsic and Tunable Properties of Two-Dimensional Transition-Metal Dichalcogenides for Optical Applications

by

Reifler, Ellen Sarah, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10811641

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structure of these materials is elucidated with high-resolution transmission electron microscopy; thickness

Cover image for Structure and Mechanical and Tribological Properties of Magnetron Sputter Deposition of Stainles-Steel Nitride and Carbide Thin Films with Transition Metal Additives

10.

Structure and Mechanical and Tribological Properties of Magnetron Sputter Deposition of Stainles-Steel Nitride and Carbide Thin Films with Transition Metal Additives

by

Alresheedi, Faisal I., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10810212

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electron microscopy (TEM), micro-hardness (Knoop indenter), nano-Indentation, and both pin-on-disk and

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