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by
Abrantes, Richard Jun Espino, author.
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high-Z ions. Hence, additional analysis is needed to properly capture detailed atomic kinetics for low
by
Jackson, Brandon A., author. (orcid)0000-0002-4148-6380
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which point the surface tension cannot contain the combined stresses and a spray of fluid or ions
by
Gao, Xiang, author.
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caused by the migration of F-- ions toward the surface as the electric field is strengthened, which makes
by
Chap, Andrew Mark, author. (orcid)0000-0002-8513-3632
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ions into ``bunches'', and thus the device operates in a pulsed mode. The use of proton-boron-11 (p-11B





