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      Cover image for Advanced Interfacing Techniques for Sensors Measurement Circuits and Systems for Intelligent Sensors
      1. 
      Advanced Interfacing Techniques for Sensors Measurement Circuits and Systems for Intelligent Sensors
      by 
      George, Boby. editor.
      http://dx.doi.org/10.1007/978-3-319-55369-6
      Format: 
      Excerpt: 
      Advanced Interfacing Techniques for Sensors Measurement Circuits and Systems for Intelligent
      Cover image for Advances in Reliability and System Engineering
      2. 
      Advances in Reliability and System Engineering
      by 
      Ram, Mangey. editor.
      http://dx.doi.org/10.1007/978-3-319-48875-2
      Format: 
      Excerpt: 
      Circuits and Systems.
      Cover image for Positive Trigonometric Polynomials and Signal Processing Applications
      3. 
      Cover image for Bond Graphs for Modelling, Control and Fault Diagnosis of Engineering Systems
      4. 
      Cover image for Production Planning and Control for Semiconductor Wafer Fabrication Facilities Modeling, Analysis, and Systems
      5. 
      Production Planning and Control for Semiconductor Wafer Fabrication Facilities Modeling, Analysis, and Systems
      by 
      Mönch, Lars. author.
      http://dx.doi.org/10.1007/978-1-4614-4472-5
      Format: 
      Excerpt: 
      takes a comprehensive look at the role of modeling, analysis, and related information systems for such
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