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by
Lee, Jonathan Marriel, author.
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A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy / Lee, Jonathan Marriel, author.
by
Wang, Congcong, author.
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surface analytic tools including photoemission and inverse photoemission spectroscopy and atomic force
by
Zhu, Pu, author.
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the materials used and printed samples were characterized using optical microscopy, rheometry, atomic
by
Johnson, Joel N., author.
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-silica ratio thin film samples was fabricated and characterized with atomic force microscopy and ultraviolet to
by
Hu, Jingjie, author.
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effective cancer targeting. A combination of atomic force microscopy (AFM) and simulation approaches are
by
Chen, Zizhao, author.
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atomic force microscopy. I show that alkali metal halides can reduce the growth temperature of MoS2 from
by
Dunlap, Bret Elliott, author.
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for microindentations and atomic force microscopy (AFM) for nanoindentations. The single crystal
by
Fairfield, Daniel Joseph, author. (orcid)0000-0001-5880-2055
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atomic force microscopy and transmission electron microscopy, perovskite crystallite sizes were observed
by
Gao, Kai, author.
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with Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). Static contact
by
International Meeting on Applied Physics (1st : 2003 : Badajoz, Spain)
ScienceDirect http://www.sciencedirect.com/science/book/9780080446486
Format:
Excerpt:
-- Characterization of Membrane Distillation Membranes by Tapping Mode Atomic Force Microscopy -- Software for