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      by 
      Sklavos, Nicolas. editor.
      Format: 
      Excerpt: 
      , manufacturing, testing, reliability, validation and utilization; Describes new methods and algorithms for the
      by 
      Deschamps, Jean-Pierre. author.
      Format: 
      Excerpt: 
      relationship between algorithms and circuits (top down approach) and on the use of high level languages (Pseudo
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