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      Cover image for A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy
      1. 
      A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy
      by 
      Lee, Jonathan Marriel, author.
      http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10821665
      Format: 
      Excerpt: 
      A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy / Lee, Jonathan Marriel, author.
      Cover image for Carrier Scattering and Localization in nm-thick Al/Ru, Al/Co and Al/Mo Superlattices
      2. 
      Cover image for Hybridization of Surface Plasmon Resonance in Immiscible Solid Composite Nanostructures
      3. 
      Hybridization of Surface Plasmon Resonance in Immiscible Solid Composite Nanostructures
      by 
      Johnson, Joel N., author.
      http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10817187
      Format: 
      Excerpt: 
      -silica ratio thin film samples was fabricated and characterized with atomic force microscopy and ultraviolet to
      Cover image for Recent advances in multidisciplinary applied physics : proceedings of the First International Meeting on Applied Physics (APHYS 2003) October 13-18th, 2003, Badajoz, Spain
      4. 
      Recent advances in multidisciplinary applied physics : proceedings of the First International Meeting on Applied Physics (APHYS 2003) October 13-18th, 2003, Badajoz, Spain
      by 
      International Meeting on Applied Physics (1st : 2003 : Badajoz, Spain)
      ScienceDirect http://www.sciencedirect.com/science/book/9780080446486
      Format: 
      Excerpt: 
      -- Characterization of Membrane Distillation Membranes by Tapping Mode Atomic Force Microscopy -- Software for
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