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Washington State University. Electrical Engineering. degree granting institution.

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Ayar, Muharrem, author.

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Brito, Nuno Andre Mano, author.

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Chittamuru, Sai Vineel Reddy, author.

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Colorado State University. Electrical and Computer Engineering. degree granting institution.

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Das, Sourav, author. (orcid)0000-0002-7404-8133

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Davis, Dylan A.P., author.

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Geng, Hui, author.

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Hong Kong University of Science and Technology (Hong Kong). Computer Science and Engineering. degree granting institution.

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Hong Kong University of Science and Technology (Hong Kong). Electronic and Computer Engineering. degree granting institution.

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Hong Kong University of Science and Technology (Hong Kong). Electronics and Computer Engineering. degree granting institution.

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Larson, Anna, author.

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Li, Xian, author.

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Loh, Felix Da Yuan, author.

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Missouri University of Science and Technology. Computer Engineering. degree granting institution.

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Oliveira, Diogo, author.

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Parchas, Panos, author.

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Purdue University. Computer and Information Technology. degree granting institution.

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Qian, Bin, author.

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Silva, Ana Eduarda de Sá, author.

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State University of New York at Binghamton. Systems Science Industrial Engineering. degree granting institution.

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The University of Wisconsin - Madison. Electrical Engineering. degree granting institution.

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Trembley, Daniel K., author.

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Universidade do Minho (Portugal). degree granting institution.

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Universidade do Porto (Portugal). degree granting institution.

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University of Florida. Electrical and Computer Engineering. degree granting institution.

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University of Massachusetts Lowell. degree granting institution.

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University of South Florida. Electrical Engineering. degree granting institution.

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Zheng, Meng, author.

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Cover image for The Reliability of Symphony Link in Emergency Scenarios

The Reliability of Symphony Link in Emergency Scenarios

1.

The Reliability of Symphony Link in Emergency Scenarios

by

Larson, Anna, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10786579

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Excerpt:

The Reliability of Symphony Link in Emergency Scenarios / Larson, Anna, author.

Cover image for Reliability and Security in Low Power Circuits and Systems

Reliability and Security in Low Power Circuits and Systems

2.

Reliability and Security in Low Power Circuits and Systems

by

Geng, Hui, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10186967

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Excerpt:

Reliability and Security in Low Power Circuits and Systems / Geng, Hui, author.

Cover image for Multi-Objective Resource Provisioning in Network Function Virtualization Infrastructures

Multi-Objective Resource Provisioning in Network Function Virtualization Infrastructures

3.

Multi-Objective Resource Provisioning in Network Function Virtualization Infrastructures

by

Oliveira, Diogo, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10788920

Format:

Excerpt:

reliability of user services. Furthermore, additionally to the ILP optimization and greedy heuristic schemes

Cover image for Fault Tolerance through Invariant Checks in Applications Using Linear Algebraic Methods

Fault Tolerance through Invariant Checks in Applications Using Linear Algebraic Methods

4.

Fault Tolerance through Invariant Checks in Applications Using Linear Algebraic Methods

by

Loh, Felix Da Yuan, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10825822

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Excerpt:

from very high fault rates. In order to ensure reliability, it is necessary to use fault tolerance (FT

Cover image for Cyber-Physical Embedded Systems with Transient Supervisory Command and Control: A Framework for Validating Safety Response in Automated Collision Avoidance Systems

Cyber-Physical Embedded Systems with Transient Supervisory Command and Control: A Framework for Validating Safety Response in Automated Collision Avoidance Systems

5.

Cyber-Physical Embedded Systems with Transient Supervisory Command and Control: A Framework for Validating Safety Response in Automated Collision Avoidance Systems

by

Trembley, Daniel K., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10827571

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Excerpt:

and affects to the reliability and safety of the CPS. The human-agent and the machine-agent are in a

Cover image for Many-to-Many Survivability in Content Centric Networks

Many-to-Many Survivability in Content Centric Networks

6.

Many-to-Many Survivability in Content Centric Networks

by

Davis, Dylan A.P., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10836944

Format:

Excerpt:

to reliability can be gained through the use of Content Centric Networking (CCN). CCN is an

Cover image for Towards Energy Efficient and Reliable 3D Manycore Chip Enabled by Machine Learning

Towards Energy Efficient and Reliable 3D Manycore Chip Enabled by Machine Learning

7.

Towards Energy Efficient and Reliable 3D Manycore Chip Enabled by Machine Learning

by

Das, Sourav, author. (orcid)0000-0002-7404-8133

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10784159

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Excerpt:

fabrication limitations and workload induced stress. We analyze the reliability concerns associated with 3D

Cover image for Network-on-chip Enabled Manycore Architectures for Cyber-physical System

Network-on-chip Enabled Manycore Architectures for Cyber-physical System

8.

Network-on-chip Enabled Manycore Architectures for Cyber-physical System

by

Li, Xian, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10785265

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Excerpt:

, performance, reliability and robustness in dealing with physical systems. The advance of peripheral techniques

Cover image for Embedded real-time processor for MEMS applications

Embedded real-time processor for MEMS applications

9.

Embedded real-time processor for MEMS applications

by

Brito, Nuno Andre Mano, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10758446

Format:

Excerpt:

at a worldwide level. The improvements on the manufacturing precision and reliability, allowed some

Cover image for Query Processing in Uncertain Graphs

Query Processing in Uncertain Graphs

10.

Query Processing in Uncertain Graphs

by

Parchas, Panos, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903375

Format:

Excerpt:

shortest path distance, page rank, clustering coefficient and reliability.

Cover image for Collaborative human-machine quality control system: Steps towards automatic machine vision inspection

Collaborative human-machine quality control system: Steps towards automatic machine vision inspection

11.

Collaborative human-machine quality control system: Steps towards automatic machine vision inspection

by

Silva, Ana Eduarda de Sá, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10758468

Format:

Excerpt:

Computer Assisted Inspection (CAI). This will continue up to a moment in which technology reliability is

Cover image for Reliable, Energy-efficient, and Secure Silicon Photonic Network-on-Chip Design for Manycore Architectures

Reliable, Energy-efficient, and Secure Silicon Photonic Network-on-Chip Design for Manycore Architectures

12.

Reliable, Energy-efficient, and Secure Silicon Photonic Network-on-Chip Design for Manycore Architectures

by

Chittamuru, Sai Vineel Reddy, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10746383

Format:

Excerpt:

cross-layer optimization strategies to aggressively improve reliability and energy-efficiency in PNoC

Cover image for Towards Resilient Smart Grids: Robust Control Framework Design to Enhance Transient Stability

Towards Resilient Smart Grids: Robust Control Framework Design to Enhance Transient Stability

13.

Towards Resilient Smart Grids: Robust Control Framework Design to Enhance Transient Stability

by

Ayar, Muharrem, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10902772

Format:

Excerpt:

technologies to enhance the efficiency, reliability, and security of electrical power systems and contribute to

Cover image for Fabrication and Characterization of Small-Grain Silicon-Based Thin-Film Transistors

Fabrication and Characterization of Small-Grain Silicon-Based Thin-Film Transistors

14.

Fabrication and Characterization of Small-Grain Silicon-Based Thin-Film Transistors

by

Zheng, Meng, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903431

Format:

Excerpt:

-grain poly-Si TFTs are low-temperature compatible, low cost, and without process variation and reliability

Cover image for Novel Error Models and Decoding Algorithms for Decode-and-Forward Based Relay Networks

Novel Error Models and Decoding Algorithms for Decode-and-Forward Based Relay Networks

15.

Novel Error Models and Decoding Algorithms for Decode-and-Forward Based Relay Networks

by

Qian, Bin, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10903377

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Relay-assisted communication has been shown to be an effective technique to improve the reliability

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