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      by 
      Karri, Naveen Kishore, author. (orcid)0000-0002-7381-9047
      Format: 
      Excerpt: 
      materials based on the common practice in the ceramics industry which considers the statistical nature of
      by 
      Mukherjee, Saptarshi, author.
      Format: 
      Excerpt: 
      because of the ability of microwaves to propagate through and interact with these materials. The scattered
      by 
      Cheng, Lin, author.
      Format: 
      Excerpt: 
      different mask materials (ITO and Shipley 1818 photo-resist) were compared. The effects of RF power, DC bias
      by 
      Zeppettella, David L., author.
      Format: 
      Excerpt: 
      structural integration perspective and is unacceptable at UHF frequencies. While RF absorbing materials have