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      Cover image for Automated Runtime Data Analysis for System Reliability Management
      1. 
      Cover image for Optimizing Mass Customization through Interaction Variability and Manufacturing Trade-offs
      2. 
      Cover image for Towards Energy Efficient and Reliable 3D Manycore Chip Enabled by Machine Learning
      3. 
      Towards Energy Efficient and Reliable 3D Manycore Chip Enabled by Machine Learning
      by 
      Das, Sourav, author. (orcid)0000-0002-7404-8133
      http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10784159
      Format: 
      Excerpt: 
      fabrication limitations and workload induced stress. We analyze the reliability concerns associated with 3D
      Cover image for Application of Machine Learning: An Analysis of Asian Options Pricing Using Neural Network
      4.