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      Cover image for SVD and signal processing III : algorithms, architectures, and applications
      1. 
      SVD and signal processing III : algorithms, architectures, and applications
      by 
      Moonen, Marc S., 1963-
      ScienceDirect http://www.sciencedirect.com/science/book/9780444821072
      Format: 
      Excerpt: 
      , as well as a variety of applications such as systems and signal modeling and detection. The
      Cover image for Proceedings IWISP '96 : 4-7 November 1996, Manchester, United Kingdom : Third International Workshop on Image and Signal Processing on the Theme of Advances in Computational Intelligence
      2. 
      Proceedings IWISP '96 : 4-7 November 1996, Manchester, United Kingdom : Third International Workshop on Image and Signal Processing on the Theme of Advances in Computational Intelligence
      by 
      International Workshop on Image and Signal Processing on the Theme of Advances in Computational Intelligence (3rd : 1996 : Manchester, England)
      ScienceDirect http://www.sciencedirect.com/science/book/9780444825872
      Format: 
      Excerpt: 
      Recognition (image analysis, edge detection, segmentation, image enhancement and restoration, adaptive systems
      Cover image for Photo-electronic image devices : proceedings of a symposium held at London, September 3-5, 1958.
      3. 
      Photo-electronic image devices : proceedings of a symposium held at London, September 3-5, 1958.
      by 
      McGee, James D.
      ScienceDirect http://www.sciencedirect.com/science/book/9780120145126
      Format: 
      Excerpt: 
      ; Chapter 20. An Experimental Image Storage Tube for the Detection of Weak Optical Images of Low Contrast
      Cover image for Fault detection, supervision and safety of technical processes 2006 : a proceedings volume from the 6th IFAC symposium, SAFEPROCESS, Beijing, P.R. China, August 30-September 1, 2006
      4. 
      Fault detection, supervision and safety of technical processes 2006 : a proceedings volume from the 6th IFAC symposium, SAFEPROCESS, Beijing, P.R. China, August 30-September 1, 2006
      by 
      IFAC Symposium on Fault Detection, Supervision, and Safety for Technical Processes (6th : 2006 : Beijing, China)
      ScienceDirect http://www.sciencedirect.com/science/book/9780080444857
      Format: 
      Excerpt: 
      and identification -- Statistical approaches -- Fault modelling -- Signal analysis -- Design measures