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      Cover image for An Integrated Model for the Probabilistic Prediction of Yield Strength in Electron-Beam Additively Manufactured Ti-6Al-4V
      1. 
      An Integrated Model for the Probabilistic Prediction of Yield Strength in Electron-Beam Additively Manufactured Ti-6Al-4V
      by 
      Ales, Thomas K., author. (orcid)0000-0002-9217-1020
      http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10787274
      Format: 
      Excerpt: 
      probability distributions, the model is verified against a rich mechanical and chemical database built from an
      Cover image for Examination of Shear Friction Design Provisions
      2. 
      Examination of Shear Friction Design Provisions
      by 
      Edgmond, Nikkolas James, author.
      http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10793521
      Format: 
      Excerpt: 
      of the established database to examine the effectiveness of the ACI 318 Code (2014), PCI Design
      Cover image for Dynamics and Control of Advanced Structures and Machines
      3. 
      Dynamics and Control of Advanced Structures and Machines
      by 
      Irschik, Hans. editor.
      http://dx.doi.org/10.1007/978-3-319-43080-5
      Format: 
      Excerpt: 
      monitoring database -- Reduced order models and localized non-linearity: an approach to the design of meta
      Cover image for Dynamic Sharing of Wireless Spectrum
      4. 
      Dynamic Sharing of Wireless Spectrum
      by 
      Zhou, Haibo. author.
      http://dx.doi.org/10.1007/978-3-319-45077-3
      Format: 
      Excerpt: 
      database-assisted white spaces spectrum sharing research results that are presented in this book provide
      Cover image for Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Module
      5. 
      Opto-Electro-Thermal Approach to Modeling Photovoltaic Performance and Reliability from Cell to Module
      by 
      Sun, Xingshu, author.
      http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10747508
      Format: 
      Excerpt: 
      -dependent degradation processes, a knowledge prerequisite for the next-generation reliability-aware design of PV systems.