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      by 
      Mandal, Jyotsna Kumar. editor.
      Format: 
      Excerpt: 
      . Device System and Modeling -- Section 6. Image Processing and Pattern Recognition -- Section 7. Security
      by 
      Satapathy, Suresh Chandra. editor.
      Format: 
      Excerpt: 
      Measurement for Visual Surveillance -- Chapter 29. Improvisation in Frequent Pattern Mining Technique
      by 
      Satapathy, Suresh Chandra. editor.
      Format: 
      Excerpt: 
      Enhanced Bug Mining for Identifying Frequent Bug Pattern Using Word Tokenizer and FP-Growth -- Chapter 53