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by
Mandal, Jyotsna Kumar. editor.
Format:
Excerpt:
. Device System and Modeling -- Section 6. Image Processing and Pattern Recognition -- Section 7. Security
by
Satapathy, Suresh Chandra. editor.
Format:
Excerpt:
Measurement for Visual Surveillance -- Chapter 29. Improvisation in Frequent Pattern Mining Technique
by
Satapathy, Suresh Chandra. editor.
Format:
Excerpt:
Enhanced Bug Mining for Identifying Frequent Bug Pattern Using Word Tokenizer and FP-Growth -- Chapter 53

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