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Bhat, Anupama, author.

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Chen, Zizhao, author.

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Clemson University. Chemistry. degree granting institution.

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Clemson University. Materials Science & Engineering. degree granting institution.

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Conrad, Catherine Alexis, author.

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Delaware State University. Optics. degree granting institution.

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Drexel University. Materials Science and Engineering (College of Engineering). degree granting institution.

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Dunlap, Bret Elliott, author.

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Fairfield, Daniel Joseph, author. (orcid)0000-0001-5880-2055

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Fei, Xing, author.

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Finch, Katie Julia, author.

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Gao, Kai, author.

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Ghosal, Sayan, author.

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Giamberardino, Jason, author.

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Hau, William, author.

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Hong Kong University of Science and Technology (Hong Kong). degree granting institution.

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Hu, Jingjie, author.

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Illinois Institute of Technology. Food Safety and Nutrition. degree granting institution.

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Johnson, Joel N., author.

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Khanal, Ashok, author. (orcid)0000-0002-7539-9998

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Lee, Jonathan Marriel, author.

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Li, Mo, author.

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McCourt, Jackie Lynn, author.

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Michigan State University. Materials Science and Engineering - Doctor of Philosophy. degree granting institution.

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Michigan Technological University. Chemistry. degree granting institution.

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Northern Arizona University. Physics and Astronomy. degree granting institution.

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Northwestern University. Materials Science and Engineering. degree granting institution.

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Princeton University. Mechanical and Aerospace Engineering. degree granting institution.

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Purdue University. Agricultural and Biological Engineering. degree granting institution.

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Purdue University. Chemistry. degree granting institution.

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Purdue University. Materials Engineering. degree granting institution.

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Ramezaniankeikanloo, Somayeh, author.

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Raybin, Jonathan G., author. (orcid)0000-0001-9040-4241

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State University of New York at Albany. Physics. degree granting institution.

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The University of Chicago. Chemistry. degree granting institution.

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The University of Manchester (United Kingdom). School of Earth, Atmospheric and Environmental Sciences. degree granting institution.

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University of South Carolina. Physics. degree granting institution.

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Uppal, Hasan Javed, author.

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Wang, Congcong, author.

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Washington State University. Chemical Engineering. degree granting institution.

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Wingender, Brian James, author.

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Yan, Runan, author.

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Zhang, Wen, author.

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Zhang, Yanli, author.

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Cover image for Defects and Dynamics in Block Copolymer Thin Films: A Study of Polymer Pattern Evolution with Environmentally-Controlled Atomic Force Microscopy

Defects and Dynamics in Block Copolymer Thin Films: A Study of Polymer Pattern Evolution with Environmentally-Controlled Atomic Force Microscopy

1.

Defects and Dynamics in Block Copolymer Thin Films: A Study of Polymer Pattern Evolution with Environmentally-Controlled Atomic Force Microscopy

by

Raybin, Jonathan G., author. (orcid)0000-0001-9040-4241

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13805457

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Excerpt:

Environmentally-Controlled Atomic Force Microscopy / Raybin, Jonathan G., author. (orcid)0000-0001-9040-4241

Cover image for Signals and Systems Tools for Advanced Nanoscale Investigation with Atomic Force Microscopy

Signals and Systems Tools for Advanced Nanoscale Investigation with Atomic Force Microscopy

2.

Signals and Systems Tools for Advanced Nanoscale Investigation with Atomic Force Microscopy

by

Ghosal, Sayan, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10259422

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Excerpt:

Signals and Systems Tools for Advanced Nanoscale Investigation with Atomic Force Microscopy /

Cover image for Nanoscale Performance, Degradation and Defect Analysis of MOS Devices Using High-kappa Dielectric Materials as Gate Stacks by Atomic Force Microscopy

Nanoscale Performance, Degradation and Defect Analysis of MOS Devices Using High-kappa Dielectric Materials as Gate Stacks by Atomic Force Microscopy

3.

Nanoscale Performance, Degradation and Defect Analysis of MOS Devices Using High-kappa Dielectric Materials as Gate Stacks by Atomic Force Microscopy

by

Uppal, Hasan Javed, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870501

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Excerpt:

Materials as Gate Stacks by Atomic Force Microscopy / Uppal, Hasan Javed, author.

Cover image for A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy

A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy

4.

A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy

by

Lee, Jonathan Marriel, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10821665

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Excerpt:

A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy / Lee, Jonathan Marriel, author.

Cover image for Two-electrode Measurements of Electrostatic Double Layer Potentials with Atomic Force Microscopy

Two-electrode Measurements of Electrostatic Double Layer Potentials with Atomic Force Microscopy

5.

Two-electrode Measurements of Electrostatic Double Layer Potentials with Atomic Force Microscopy

by

Giamberardino, Jason, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10743560

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Excerpt:

Two-electrode Measurements of Electrostatic Double Layer Potentials with Atomic Force Microscopy /

Cover image for Probing the Interaction between Nanoparticles and Lipid Vesicles

Probing the Interaction between Nanoparticles and Lipid Vesicles

6.

Probing the Interaction between Nanoparticles and Lipid Vesicles

by

Bhat, Anupama, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10808342

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Excerpt:

spectroscopy, fluorescence microscopy, atomic force microscopy (AFM), as well as hyperspectral dark

Cover image for Materials Stability of Organometal Halides for Solar Cell Applications

Materials Stability of Organometal Halides for Solar Cell Applications

7.

Materials Stability of Organometal Halides for Solar Cell Applications

by

Wang, Congcong, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10793566

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Excerpt:

surface analytic tools including photoemission and inverse photoemission spectroscopy and atomic force

Cover image for Carrier Scattering and Localization in nm-thick Al/Ru, Al/Co and Al/Mo Superlattices

Carrier Scattering and Localization in nm-thick Al/Ru, Al/Co and Al/Mo Superlattices

8.

Carrier Scattering and Localization in nm-thick Al/Ru, Al/Co and Al/Mo Superlattices

by

Zhang, Yanli, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10812413

Format:

Excerpt:

The abruptness and smoothness of the interfaces are evaluated by atomic force microscopy (AFM

Cover image for Synthesis and Characterization of Novel Diphosphonium Polymers with the Emphasis on Supramolecular Assembly

Synthesis and Characterization of Novel Diphosphonium Polymers with the Emphasis on Supramolecular Assembly

9.

Synthesis and Characterization of Novel Diphosphonium Polymers with the Emphasis on Supramolecular Assembly

by

Conrad, Catherine Alexis, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10791691

Format:

Excerpt:

-ray crystallography, and layer-by-layer analysis tracked with UV-vis spectroscopy and atomic force microscopy

Cover image for Polymer Materials via Melt Based 3D Printing: Fabrication and Characterization

Polymer Materials via Melt Based 3D Printing: Fabrication and Characterization

10.

Polymer Materials via Melt Based 3D Printing: Fabrication and Characterization

by

Zhu, Pu, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10810308

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Excerpt:

the materials used and printed samples were characterized using optical microscopy, rheometry, atomic

Cover image for Hybridization of Surface Plasmon Resonance in Immiscible Solid Composite Nanostructures

Hybridization of Surface Plasmon Resonance in Immiscible Solid Composite Nanostructures

11.

Hybridization of Surface Plasmon Resonance in Immiscible Solid Composite Nanostructures

by

Johnson, Joel N., author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10817187

Format:

Excerpt:

-silica ratio thin film samples was fabricated and characterized with atomic force microscopy and ultraviolet to

Cover image for Breast Cancer Detection: From Tumor-specific Nanoparticles to Cell Mechanics

Breast Cancer Detection: From Tumor-specific Nanoparticles to Cell Mechanics

12.

Breast Cancer Detection: From Tumor-specific Nanoparticles to Cell Mechanics

by

Hu, Jingjie, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815406

Format:

Excerpt:

effective cancer targeting. A combination of atomic force microscopy (AFM) and simulation approaches are

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