Search Results for Atomic force microscopy.

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Marti, Othmar.

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-spring, the scanning force microscope (SFM), resolve surface topography at the atomic scale. They also detect

Cahn, R. W. (Robert W.), 1924-2007.

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Properties; Art Forgeries: Scientific Detection; Atomic Force Microscopy; Auger Electron Spectroscopy; Auger

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