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by
Morris, Peter, author.
Format:
Excerpt:
Reflection Infrared Spectroscopy, X-ray Scattering Techniques, and Surface Titrations / Morris, Peter, author.
by
Yang, Lin, author.
Format:
Excerpt:
ion mass spectroscopy (TOFSIMS), scanning electron microscopy coupled with energy-dispersive X-ray
by
Chen, Jiuhua, 1962-
ScienceDirect http://www.sciencedirect.com/science/book/9780444519795
Format:
Excerpt:
determination and refinement by X-ray diffraction / Ross J. Angel -- Nuclear resonant inelastic X-ray scattering

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