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      by 
      Müller-Reichert, Thomas, editor.
      Format: 
      Excerpt: 
      Correlative light and electron microscopy II / Müller-Reichert, Thomas, editor.
      by 
      Oku, Takeo, author.
      Format: 
      Excerpt: 
      Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy /
      by 
      Fujikawa, K., editor.
      Format: 
      Excerpt: 
      Electron microscopy.
      by 
      International Conference on the Strength of Metals and Alloys (5th : 1979 : Aachen, Germany)
      Format: 
      Excerpt: 
      , in-situ electron microscopy during deformation combination of elementary hardening mechanisms.--v. 3