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      by 
      Lanza, Mario, editor.
      Format: 
      Excerpt: 
      Conductive atomic force microscopy : applications in nanomaterials / Lanza, Mario, editor.
      by 
      Ikai, Atsushi, editor.
      Format: 
      Excerpt: 
      Atomic force microscopy.
      by 
      Bhushan, Bharat. editor.
      Format: 
      Excerpt: 
      Lateral Forces in Cantilevers used in Atomic Force Microscopy -- Biomedical Sensing with the Atomic Force
      by 
      McCourt, Jackie Lynn, author.
      Format: 
      Excerpt: 
      force microscopy (AFM), we show here the first mechanical characterization of utrophin and functionally
      by 
      Gao, Kai, author.
      Format: 
      Excerpt: 
      with Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). Static contact