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by
Lanza, Mario, editor.
Format:
Excerpt:
Conductive atomic force microscopy : applications in nanomaterials / Lanza, Mario, editor.
by
Ghosal, Sayan, author.
Format:
Excerpt:
Signals and Systems Tools for Advanced Nanoscale Investigation with Atomic Force Microscopy /
by
Ikai, Atsushi, editor.
Format:
Excerpt:
Atomic force microscopy.
by
Bhushan, Bharat. editor.
Format:
Excerpt:
Lateral Forces in Cantilevers used in Atomic Force Microscopy -- Biomedical Sensing with the Atomic Force
by
Wingender, Brian James, author.
Format:
Excerpt:
, atomic force microscopy, and Raman microanalysis. The synthesis and advanced characterization of these
by
Li, Mo, author.
Format:
Excerpt:
(PAGE) and atomic force microscopy (AFM) imaging.
by
McCourt, Jackie Lynn, author.
Format:
Excerpt:
force microscopy (AFM), we show here the first mechanical characterization of utrophin and functionally
by
Gao, Kai, author.
Format:
Excerpt:
with Fourier transform infrared spectroscopy (FTIR) and atomic force microscopy (AFM). Static contact

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