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      by 
      Spiegelberg, Jakob, author.
      Format: 
      Excerpt: 
      Signal processing tools for electron microscopy / Spiegelberg, Jakob, author.
      by 
      Bundschu, Colin R., author. (orcid)0000-0001-7592-9891
      Format: 
      Excerpt: 
      The Impact of Sample Tilt on Scanning Transmission Electron Microscopy in Strontium Titanate /
      by 
      International Conference on the Strength of Metals and Alloys (5th : 1979 : Aachen, Germany)
      Format: 
      Excerpt: 
      , in-situ electron microscopy during deformation combination of elementary hardening mechanisms.--v. 3
      by 
      Ma, Junyan, author.
      Format: 
      Excerpt: 
      magnetic resonance (NMR) and electron microscopy (EM), and X-ray scattering (SAXS) and circular dichroism