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by
Farber, Rachael G., author.
Format:
Excerpt:
electron diffraction (LEED) and scanning tunneling microscopy (STM).
by
Nguyen, Hoang Long, author. (orcid)0000-0003-2748-0385
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Excerpt:
resolution spin-noise image of a single electron spin and a 4-to-10 nm resolution spin-noise image of few
by
Isaac, Corinne Elizabeth, author. (orcid)0000-0002-5759-7691
Format:
Excerpt:
microscopy (MRFM) couples the sensitivity of scanning probe microscopy with the isotopic specificity of

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