Search Results for Electron microscopy.

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Kodali, Mounika, author.

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samples. The samples were then characterized using Scanning Electron Microscopy (SEM) and a uniform growth

$Cover image for Comparison of Barrier Heights of Selected Refractory Metals on Porous P-Type Silicon$

Selvam, Karthik, author.

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After etching, the pores can be observed using Scanning Electron Microscopy. When the formation of

Li, Xiang, author.

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properties of these stacks via high resolution transmission electron microscopy (TEM). The insight obtained

Hau, William, author.

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Surface morphology was observed by Atomic Force Microscopy (AFM) and Scanning Electron Microscopy

Waddell, Ewan MacKinnon, author.

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. Chapters (1) and (2) discuss basic aspects of phase contrast electron microscopy, whilst chapter (3) gives

Liu, Dong, author.

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IMC dealloying) is closely relating to the chloride. Transmission electron microscopy (TEM) reveals

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