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      by 
      Bundschu, Colin R., author. (orcid)0000-0001-7592-9891
      Format: 
      Excerpt: 
      The Impact of Sample Tilt on Scanning Transmission Electron Microscopy in Strontium Titanate /
      by 
      Wang, Congcong, author.
      Format: 
      Excerpt: 
      microscopy, and other tools such as X-ray diffraction and scanning electron microscopy have been used to
      by 
      Parkin, William M., author.
      Format: 
      Excerpt: 
      -gap quantum spin Hall insulators. We use aberration-corrected scanning electron microscopy to characterize the
      by 
      McKendrick, William H., author.
      Format: 
      Excerpt: 
      capabilities of electron microscopy. In the present work ion beam thinning has been used to prepare foils of