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      Cover image for Electronics reliability and measurement technology : nondestructive evaluation
      1. 
      Electronics reliability and measurement technology : nondestructive evaluation
      by 
      Heyman, Joseph S.
      MacEwan University Access (Unlimited Concurrent Users) from ScienceDirect
      ScienceDirect https://www.sciencedirect.com/science/book/9780815511717
      Format: 
      Excerpt: 
      Integrated circuits -- Reliability -- Congresses.
      Cover image for Coupled nonlinear oscillators : proceedings of the Joint U.S. Army-Center for Nonlinear Studies workshop, held in Los Alamos, New Mexico, 21-23 July, 1981
      2. 
      Cover image for Networks on chips : technology and tools
      3. 
      Networks on chips : technology and tools
      by 
      Benini, Luca, 1967-
      ScienceDirect https://www.sciencedirect.com/science/book/9780123705211
      Format: 
      Excerpt: 
      TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated.
      Cover image for Algorithms and parallel VLSI architectures III : proceedings of the International Workshop, Algorithms and Parallel VLSI Architectures III, Leuven, Belgium, August 29-31, 1994
      4. 
      Algorithms and parallel VLSI architectures III : proceedings of the International Workshop, Algorithms and Parallel VLSI Architectures III, Leuven, Belgium, August 29-31, 1994
      by 
      International Workshop on Algorithms and Parallel VLSI Architectures (3rd : 1994 : Louvain, Belgium)
      ScienceDirect http://www.sciencedirect.com/science/book/9780444821065
      Format: 
      Excerpt: 
      Integrated circuits -- Very large scale integration -- Congresses.
      Cover image for Silicon molecular beam epitaxy : proceedings of the 3rd International Symposium on Silicon Molecular Beam Epitaxy, Symposium A of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989
      5. 
      Silicon molecular beam epitaxy : proceedings of the 3rd International Symposium on Silicon Molecular Beam Epitaxy, Symposium A of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989
      by 
      International Symposium on Silicon Molecular Beam Epitaxy (3rd : 1989 : Strasbourg, France)
      ScienceDirect http://www.sciencedirect.com/science/book/9780444886200
      ScienceDirect https://www.sciencedirect.com/science/book/9780444886200
      Format: 
      Excerpt: 
      SiGe alloys (S.S. Iyer et al.). Silicon-based millimeter-wave integrated circuits (J-F. Luy