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Subject: Electrical engineering.

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SpringerLink (Online service)

(8)

Satapathy, Suresh Chandra. editor.

(3)

Bhateja, Vikrant. editor.

(2)

Iowa State University. Electrical and Computer Engineering. degree granting institution.

(2)

Joshi, Amit. editor.

(2)

Oklahoma State University. Electrical Engineering. degree granting institution.

(2)

State University of New York at Buffalo. Electrical Engineering. degree granting institution.

(2)

The Ohio State University. Electrical and Computer Engineering. degree granting institution.

(2)

Amirieliasi, Parisa, author.

(1)

Andrade, Salvador Canales, author.

(1)

Baniya, Abiral, author.

(1)

Bhattacharyya, Debabrata, author.

(1)

Bucossi, Andrew Robert, author.

(1)

Cifuentes, Diego, author.

(1)

Clemson University. Electrical & Computer Engineering. degree granting institution.

(1)

Colorado Technical University. Computer Science. degree granting institution.

(1)

Crespi, Noel. author.

(1)

Cui, Nan, author. (orcid)0000-0002-2746-7415

(1)

Erginsav, Aynur, author.

(1)

Freewan, Ibrahim, author.

(1)

Gaire, Kishor, author.

(1)

Habibi Gharakheili, Hassan. author.

(1)

Hossain, S. M. Istiaque, author.

(1)

Hu, Yang, author.

(1)

Huang, Weiyu, author.

(1)

Huang, Yun-Chiao, author.

(1)

Illinois Institute of Technology. Electrical and Computer Engineering. degree granting institution.

(1)

Kimura, Adam G., author.

(1)

Massachusetts Institute of Technology. degree granting institution.

(1)

Mattfeld, Ryan Stephen, author.

(1)

Minerva, Roberto. author.

(1)

Mishra, Amit Kumar. author.

(1)

Modi, Nilesh. editor.

(1)

Nakarmi, Ukash, author. (orcid)0000-0002-5351-3956

(1)

Nath, Vijay. editor.

(1)

New York University Tandon School of Engineering. Electrical and Computer Engineering. degree granting institution.

(1)

Olorunsola, Folorunso Allan, author.

(1)

Pham, Thach Ngoc, author.

(1)

Poosarla, Sai Lalitha Dattatreya, author.

(1)

Pornpojratanakul, Vinai, author.

(1)

Prasad, V. Kamakshi. editor.

(1)

Purdue University. Electrical and Computer Engineering. degree granting institution.

(1)

Raju, K. Srujan. editor.

(1)

Rani, B. Padmaja. editor.

(1)

Rochester Institute of Technology. Microsystems Engineering. degree granting institution.

(1)

Sharma, Ankit, author.

(1)

Shea, Adam, author.

(1)

South Dakota State University. Electrical Engineering & Computer Science. degree granting institution.

(1)

Stender, Matthew George, author.

(1)

The University of Akron. Electrical Engineering. degree granting institution.

(1)

The University of Mississippi. Electrical Engineering. degree granting institution.

(1)

The University of Texas at El Paso. Electrical Eng.. degree granting institution.

(1)

The University of Wisconsin - Madison. Electrical Engineering. degree granting institution.

(1)

Thomas, David T.

(1)

Thornton, Douglas, author.

(1)

Tripathy, Ardhendu Shekhar, author. (orcid)0000-0003-1893-4891

(1)

Trivedi, Bhushan. editor.

(1)

Udgata, Siba K. editor.

(1)

University of Arkansas. Engineering. degree granting institution.

(1)

University of California, Los Angeles. Materials Science and Engineering 0328. degree granting institution.

(1)

University of Florida. Electrical and Computer Engineering. degree granting institution.

(1)

University of Florida. degree granting institution.

(1)

University of Glasgow (United Kingdom). Department not provided. degree granting institution.

(1)

University of Glasgow (United Kingdom). Department of Electronics and Electrical Engineering. degree granting institution.

(1)

University of Maryland, College Park. Electrical Engineering. degree granting institution.

(1)

University of Minnesota. Electrical Engineering. degree granting institution.

(1)

University of Pennsylvania. Electrical and Systems Engineering. degree granting institution.

(1)

University of South Carolina. Electrical Engineering. degree granting institution.

(1)

University of Southern California. Electrical Engineering. degree granting institution.

(1)

Utah State University. Electrical and Computer. degree granting institution.

(1)

Verma, Pramode. editor.

(1)

Verster, Ryno Strauss. author.

(1)

Wang, Hongjie, author.

(1)

Wang, Yifei, author.

(1)

Washington University in St. Louis. Electrical Engineering. degree granting institution.

(1)

Wen, Xiao, author.

(1)

Western Carolina University. Engineering and Engineering Technology. degree granting institution.

(1)

Wijeratne, Dissanayakage Geethika, author.

(1)

Wright, Michael Damon, author.

(1)

Wu, Yuteng, author.

(1)

Yoo, Yung-Jun, author.

(1)

Zhang, Liyuan, author.

(1)

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Subject

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Communications Engineering, Networks.

(8)

(5)

Computer science.

(4)

(3)

Computational intelligence.

(3)

Nanotechnology.

(3)

(2)

(2)

(2)

(2)

(2)

Applied mathematics.

(2)

Artificial Intelligence (incl. Robotics).

(2)

Artificial intelligence.

(2)

Computer Communication Networks.

(2)

Computer communication systems.

(2)

Computer engineering.

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Computer security.

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Materials science.

(2)

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Systems and Data Security.

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Bioengineering.

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Bioinformatics.

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Biomedical engineering.

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Chemical engineering.

(1)

Circuits and Systems.

(1)

Computational Biology/Bioinformatics.

(1)

(1)

Control engineering.

(1)

(1)

Electronic books.

(1)

Electronic circuits.

(1)

Elektromagnetismus

(1)

Engineering Economics, Organization, Logistics, Marketing.

(1)

Engineering economics.

(1)

Engineering economy.

(1)

Industrial safety.

(1)

Information Systems and Communication Service.

(1)

Information science.

(1)

Information technology.

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Medical imaging.

(1)

Nanotechnology and Microengineering.

(1)

(1)

(1)

Quality Control, Reliability, Safety and Risk.

(1)

Quality control.

(1)

(1)

Security Science and Technology.

(1)

Signal, Image and Speech Processing.

(1)

Special Purpose and Application-Based Systems.

(1)

Special purpose computers.

(1)

(1)

(1)

TECHNOLOGY & ENGINEERING -- Mechanical.

(1)

Électrotechnique.

(1)

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Cover image for Maximizing Cache Value for Distributing Content via Small Cells in 5G

Maximizing Cache Value for Distributing Content via Small Cells in 5G

1.

Maximizing Cache Value for Distributing Content via Small Cells in 5G

by

Freewan, Ibrahim, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10681657

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Excerpt:

Maximizing Cache Value for Distributing Content via Small Cells in 5G / Freewan, Ibrahim, author.

Cover image for Compressive Sensing Based Algorithms for Electronic Defence

Compressive Sensing Based Algorithms for Electronic Defence

2.

Compressive Sensing Based Algorithms for Electronic Defence

by

Mishra, Amit Kumar. author.

http://dx.doi.org/10.1007/978-3-319-46700-9

Format:

Excerpt:

application value and performance-related parameters of compressive sensing in scenarios such as direction

Cover image for Design and Control of Series Resonant Converters for DC Current Power Distribution Applications

Design and Control of Series Resonant Converters for DC Current Power Distribution Applications

3.

Design and Control of Series Resonant Converters for DC Current Power Distribution Applications

by

Wang, Hongjie, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10831031

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Excerpt:

scenarios as well, which greatly increases their value.

Cover image for Non-Orthogonal Multiple Access System Based on Combinatorial Design

Non-Orthogonal Multiple Access System Based on Combinatorial Design

4.

Non-Orthogonal Multiple Access System Based on Combinatorial Design

by

Wu, Yuteng, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10810655

Format:

Excerpt:

value decomposition (SVD) on the circulant matrix. After that, we present a Multiuser Multidimensional

Cover image for Improving Time-of-flight and Other Depth Images: Super-resolution and Denoising Using Variational Methods

Improving Time-of-flight and Other Depth Images: Super-resolution and Denoising Using Variational Methods

5.

Improving Time-of-flight and Other Depth Images: Super-resolution and Denoising Using Variational Methods

by

Andrade, Salvador Canales, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10815216

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Excerpt:

random value.

Cover image for Zero-Day Vulnerability In Software-Defined Networks: A Quantitative Study

Zero-Day Vulnerability In Software-Defined Networks: A Quantitative Study

6.

Zero-Day Vulnerability In Software-Defined Networks: A Quantitative Study

by

Olorunsola, Folorunso Allan, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823009

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Excerpt:

study facilitate understanding value-at-risk assessment among telecoms service provider, executive

Cover image for Misalignment Detection in X-Ray Microtomographic Imaging System

Misalignment Detection in X-Ray Microtomographic Imaging System

7.

Misalignment Detection in X-Ray Microtomographic Imaging System

by

Pornpojratanakul, Vinai, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10823911

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Excerpt:

pattern defines a value of a misaligned parameter. Once knowing an incorrect variable and its value, the

Cover image for Highly Sensitive Electronic Skins

Highly Sensitive Electronic Skins

8.

Highly Sensitive Electronic Skins

by

Huang, Yun-Chiao, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10825886

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achieve a highest value of ~ 2.61 x 107 kPa-1 (vs. the previous record of 192 kPa-1). Along with ultrafast

Cover image for The Role of SDN in Broadband Networks

The Role of SDN in Broadband Networks

9.

The Role of SDN in Broadband Networks

by

Habibi Gharakheili, Hassan. author.

http://dx.doi.org/10.1007/978-981-10-3479-4

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exercise control over streams of high monetary value; and for Internet service providers (ISPs), who have

Cover image for Impacts of Time Delay and False Data Injection Attacks on Power System Control Loops

Impacts of Time Delay and False Data Injection Attacks on Power System Control Loops

10.

Impacts of Time Delay and False Data Injection Attacks on Power System Control Loops

by

Poosarla, Sai Lalitha Dattatreya, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10602039

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determined range. Any value other than that moves the system towards instability. Also, it is observed that

Cover image for Engineering electromagnetics

Engineering electromagnetics

11.

Engineering electromagnetics

by

Thomas, David T.

ScienceDirect https://www.sciencedirect.com/science/book/9780080167787

Format:

Excerpt:

; Exercises; Problems; References; Introduction; Chapter 5. Boundary Value Problems; Boundary Values and

Cover image for Sub-10nm Transistors for Low Power Computing: Tunnel FETs and Negative Capacitance FETs

Sub-10nm Transistors for Low Power Computing: Tunnel FETs and Negative Capacitance FETs

12.

Sub-10nm Transistors for Low Power Computing: Tunnel FETs and Negative Capacitance FETs

by

Sharma, Ankit, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10751825

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Excerpt:

in TFETs from their ideal value. To solve this problem, undoped source GaSb-InAs TFET in an i

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