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      Cover image for Nanometer CMOS ICs From Basics to ASICs
      1. 
      Nanometer CMOS ICs From Basics to ASICs
      by 
      J.M. Veendrick, Harry. author.
      http://dx.doi.org/10.1007/978-3-319-47597-4
      Format: 
      Excerpt: 
      consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging
      Cover image for Trends in Software Testing
      2. 
      Trends in Software Testing
      by 
      Mohanty, Hrushikesha. editor.
      http://dx.doi.org/10.1007/978-981-10-1415-4
      Format: 
      Excerpt: 
      topics covered include uncertainty in testing, software security testing, testing as a service, test
      Cover image for The Dark Side of Silicon Energy Efficient Computing in the Dark Silicon Era
      3. 
      The Dark Side of Silicon Energy Efficient Computing in the Dark Silicon Era
      by 
      Rahmani, Amir M. editor.
      http://dx.doi.org/10.1007/978-3-319-31596-6
      Format: 
      Excerpt: 
      Software-Based Self-Testing in the Dark Silicon Era -- Adroit Use of Dark Silicon for Power, Performance