Search Results for Integrated circuits -- Reliability.

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J.M. Veendrick, Harry. author.

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CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and

Todri-Sanial, Aida. editor.

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improve the performance, reliability and integration of 3D integrated circuits (ICs). This book will be

Dou, Wei, author.

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monolithically integrated into well-established and high-yield Si integrated circuits, which is favorable for

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