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      Cover image for Sequential methods in pattern recognition and machine learning
      1. 
      Cover image for Multi-label dimensionality reduction
      2. 
      Multi-label dimensionality reduction
      by 
      Liang Sun.
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      Format: 
      Excerpt: 
      Chapman & Hall/CRC machine learning & pattern recognition series
      Cover image for Pattern classification using ensemble methods
      3. 
      Pattern classification using ensemble methods
      by 
      Rokach, Lior.
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      Format: 
      Excerpt: 
      Pattern recognition systems.
      Cover image for Bridging the gap between graph edit distance and kernel machines
      4. 
      Bridging the gap between graph edit distance and kernel machines
      by 
      Neuhaus, Michel.
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      Format: 
      Excerpt: 
      Pattern recognition systems.
      Cover image for Machine interpretation of patterns image analysis and data mining
      5. 
      Machine interpretation of patterns image analysis and data mining
      by 
      De, Rajat K.
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      Format: 
      Excerpt: 
      Pattern recognition systems.
      Cover image for 3D shape analysis : fundamentals, theory, and applications
      6. 
      3D shape analysis : fundamentals, theory, and applications
      by 
      Laga, Hamid, author.
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      Format: 
      Excerpt: 
      Pattern recognition systems.