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      by 
      Ishida, Hatsuo.
      Format: 
      Excerpt: 
      7.2. Scanning Tunneling Microscopy. 7.3. Atomic Force Microscopy. 7.4. Surface Modifications with
      by 
      Cahn, R. W. (Robert W.), 1924-2007.
      Format: 
      Excerpt: 
      Properties; Art Forgeries: Scientific Detection; Atomic Force Microscopy; Auger Electron Spectroscopy; Auger