Search ResultsElectronic Resources
4 Results Found Subscribe to search results
0000DEFAULT
Print
Select a list
Make this your default list.
The following items were successfully added.
    There was an error while adding the following items. Please try again.
      by 
      Bhat, Anupama, author.
      Format: 
      Excerpt: 
      spectroscopy, fluorescence microscopy, atomic force microscopy (AFM), as well as hyperspectral dark
      by 
      Bhushan, Bharat. editor.
      Format: 
      Excerpt: 
      Lateral Forces in Cantilevers used in Atomic Force Microscopy -- Biomedical Sensing with the Atomic Force
      by 
      Wang, Congcong, author.
      Format: 
      Excerpt: 
      surface analytic tools including photoemission and inverse photoemission spectroscopy and atomic force