Search ResultsElectronic Resources 
by
Bhat, Anupama, author.
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Excerpt:
spectroscopy, fluorescence microscopy, atomic force microscopy (AFM), as well as hyperspectral dark
by
Bhushan, Bharat. editor.
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Excerpt:
Lateral Forces in Cantilevers used in Atomic Force Microscopy -- Biomedical Sensing with the Atomic Force
by
Wang, Congcong, author.
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Excerpt:
surface analytic tools including photoemission and inverse photoemission spectroscopy and atomic force
by
Ramezaniankeikanloo, Somayeh, author.
Format:
Excerpt:
that, atomic force microscopy (AFM) was used to quantify forces acting between P. putida surface

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