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      by 
      Hujsak, Karl, author. (orcid)0000-0003-3188-9730
      Format: 
      Excerpt: 
      Computational Electron Microscopy for the Characterization of Soft, Hard, and Hybrid Materials /
      by 
      Wang, Congcong, author.
      Format: 
      Excerpt: 
      microscopy, and other tools such as X-ray diffraction and scanning electron microscopy have been used to
      by 
      Milian, Luis Miguel Martinez, author.
      Format: 
      Excerpt: 
      broad range of experimental measurements such as x-ray diffraction, transmission electron microscopy, x