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by
Milian, Luis Miguel Martinez, author.
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broad range of experimental measurements such as x-ray diffraction, transmission electron microscopy, x-ray
by
Call, Robert W., author.
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used for this study include x-ray diffraction, x-ray photoelectron spectroscopy, UV-Vis absorption, and
by
Campbell, Gavin Paul, author.
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-resolution synchrotron X-ray characterization techniques to probe the interface between 2D materials and their growth
by
Tessema, Misle M., author.
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. Characterization techniques employed in this study are: depth profilemeter, x-ray photoelectron spectroscopy
by
Corbett, Joseph P., author.
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find two lowest energy reconstructions of the MnGa(001) face: a (1x1) Ga-terminated structure and a (1x
by
Alresheedi, Faisal I., author.
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of these films. These techniques include x-ray photoelectron spectroscopy (XPS), X-ray diffraction

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