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      by 
      Milian, Luis Miguel Martinez, author.
      Format: 
      Excerpt: 
      broad range of experimental measurements such as x-ray diffraction, transmission electron microscopy, x-ray
      by 
      Campbell, Gavin Paul, author.
      Format: 
      Excerpt: 
      -resolution synchrotron X-ray characterization techniques to probe the interface between 2D materials and their growth
      by 
      Tessema, Misle M., author.
      Format: 
      Excerpt: 
      . Characterization techniques employed in this study are: depth profilemeter, x-ray photoelectron spectroscopy
      by 
      Corbett, Joseph P., author.
      Format: 
      Excerpt: 
      find two lowest energy reconstructions of the MnGa(001) face: a (1x1) Ga-terminated structure and a (1x