Search ResultsElectronic Resources 
by
Kandalaft, Tarek, author.
Format:
Excerpt:
, scanning electron microscopy (SEM) was used to examine any microstructure or superstructure development or
by
Sedai, Bhishma Raj, author.
Format:
Excerpt:
using contact angle measurements and scanning electron microscopy.
by
Damon, Corey A., author.
Format:
Excerpt:
been evaluated by contact angle analysis, scanning electron microscopy (SEM), and inductively coupled
by
Rizzieri, Rosalba, author.
Format:
Excerpt:
dynamic mechanical tests, supported by electron microscopy, provide further insight into the cavitation

Select an Action





