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by
Sarid, Dror.
Format:
Excerpt:
Scanning force microscopy with applications to electric, magnetic, and atomic forces / Sarid, Dror.
by
Zhao, Yiping.
ScienceDirect http://www.sciencedirect.com/science/book/9780124759848
Format:
Excerpt:
principles, experimentation, and limitations of advanced real-space imaging techniques (such as atomic force

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