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      by 
      Meneghini, Matteo. editor.
      Format: 
      Excerpt: 
      Power GaN Devices Materials, Applications and Reliability / Meneghini, Matteo. editor.
      by 
      Bhugra, Harmeet. editor.
      Format: 
      Excerpt: 
      Implementation of Piezoelectric MEMS Resonators -- Reliability and Quality Assessment (Stability and Packages
      by 
      Li, Yan. editor.
      Format: 
      Excerpt: 
      .-Materials and Processing of TSV.-Microstructural and Reliability Issues of TSV -- Fundamentals and failures
      by 
      Lu, Daniel. editor.
      Format: 
      Excerpt: 
      Materials and Processing Perspective -- Flip-Chip Underfill: Materials, Process and Reliability -- New
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