Search Results for Atomic force microscopy.

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Cover image for Nanoscale Performance, Degradation and Defect Analysis of MOS Devices Using High-kappa Dielectric Materials as Gate Stacks by Atomic Force Microscopy

13.

Nanoscale Performance, Degradation and Defect Analysis of MOS Devices Using High-kappa Dielectric Materials as Gate Stacks by Atomic Force Microscopy

Uppal, Hasan Javed, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:13870501

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Materials as Gate Stacks by Atomic Force Microscopy / Uppal, Hasan Javed, author.

14.

A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy

Lee, Jonathan Marriel, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10821665

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A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy / Lee, Jonathan Marriel, author.

15.

Two-electrode Measurements of Electrostatic Double Layer Potentials with Atomic Force Microscopy

Giamberardino, Jason, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10743560

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Two-electrode Measurements of Electrostatic Double Layer Potentials with Atomic Force Microscopy /

16.

The world of nano-biomechanics

Ikai, Atsushi, editor.

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Atomic force microscopy.

17.

Advances in imaging and electron physics. Volume 135

Hawkes, P. W.

ScienceDirect http://www.sciencedirect.com/science/book/9780120147779

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Atomic force microscopy.

18.

Probing the Interaction between Nanoparticles and Lipid Vesicles

Bhat, Anupama, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10808342

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spectroscopy, fluorescence microscopy, atomic force microscopy (AFM), as well as hyperspectral dark

19.

Nanotribology and Nanomechanics An Introduction

Bhushan, Bharat. editor.

http://dx.doi.org/10.1007/978-3-319-51433-8

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Lateral Forces in Cantilevers used in Atomic Force Microscopy -- Biomedical Sensing with the Atomic Force

20.

Nanotechnology in the food, beverage and nutraceutical industries

Huang, Qingrong.

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, beverages and nutraceuticals -- 4. Regulatory frameworks for food nanotechnologies -- 5. Atomic force

21.

Structure-based study of viral replication with CD-ROM

Cheng, R. Holland.

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of viruses at the Virginia Bioinformatics Institute -- Virus architecture probed by atomic force

22.

Characterization of composite materials

Ishida, Hatsuo.

ScienceDirect http://www.sciencedirect.com/science/book/9780750693868

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7.2. Scanning Tunneling Microscopy. 7.3. Atomic Force Microscopy. 7.4. Surface Modifications with

23.

STM and SFM in biology

Marti, Othmar.

ScienceDirect http://www.sciencedirect.com/science/book/9780124745001

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-spring, the scanning force microscope (SFM), resolve surface topography at the atomic scale. They also detect

24.

Materials Stability of Organometal Halides for Solar Cell Applications

Wang, Congcong, author.

http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqm&rft_dat=xri:pqdiss:10793566

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surface analytic tools including photoemission and inverse photoemission spectroscopy and atomic force

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